Far field subwavelength focusing using optical eigenmodes

Jörg Baumgartl; Sebastian Kosmeier; Michael Mazilu; Edward T.F. Rogers; Nikolay I. Zheludev; Kishan Dholakia

doi:10.1063/1.3587636

Far field subwavelength focusing using optical eigenmodes

Jörg Baumgartl, Sebastian Kosmeier, Michael Mazilu, Edward T.F. Rogers, Nikolay I. Zheludev, Kishan Dholakia

Department of Physics

Research output: Contribution to journal › Article › peer-review

37 Citations (Scopus)

Abstract

We report the focusing of light to generate a subdiffractive, subwavelength focal spot of full width half maximum 222 nm at an operating wavelength of 633 nm using an optical eigenmode approach. Crucially, the spot is created in the focal plane of a microscope objective thus yielding a practical working distance for applications. The optical eigenmode approach is implemented using an optimal superposition of Bessel beams on a spatial light modulator. The effects of partial coherence are also discussed. This far field method is a key advance toward the generation of subdiffractive optical features for imaging and lithographic purposes.

Original language	English
Article number	181109
Journal	Applied Physics Letters
Volume	98
Issue number	18
DOIs	https://doi.org/10.1063/1.3587636
Publication status	Published - 2011 May 2

Bibliographical note

Funding Information:
We thank the UK Engineering and Physical Sciences Research Council for funding (grant EP/F040644/1) and Mark Dennis for helpful discussions. K.D. is a Royal Society Wolfson Merit Award Holder.

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.3587636

Cite this

@article{d985b9c638b24dee8e8004e26bce366d,

title = "Far field subwavelength focusing using optical eigenmodes",

abstract = "We report the focusing of light to generate a subdiffractive, subwavelength focal spot of full width half maximum 222 nm at an operating wavelength of 633 nm using an optical eigenmode approach. Crucially, the spot is created in the focal plane of a microscope objective thus yielding a practical working distance for applications. The optical eigenmode approach is implemented using an optimal superposition of Bessel beams on a spatial light modulator. The effects of partial coherence are also discussed. This far field method is a key advance toward the generation of subdiffractive optical features for imaging and lithographic purposes.",

author = "J{\"o}rg Baumgartl and Sebastian Kosmeier and Michael Mazilu and Rogers, {Edward T.F.} and Zheludev, {Nikolay I.} and Kishan Dholakia",

note = "Funding Information: We thank the UK Engineering and Physical Sciences Research Council for funding (grant EP/F040644/1) and Mark Dennis for helpful discussions. K.D. is a Royal Society Wolfson Merit Award Holder.",

year = "2011",

month = may,

day = "2",

doi = "10.1063/1.3587636",

language = "English",

volume = "98",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "18",

}

TY - JOUR

T1 - Far field subwavelength focusing using optical eigenmodes

AU - Baumgartl, Jörg

AU - Kosmeier, Sebastian

AU - Mazilu, Michael

AU - Rogers, Edward T.F.

AU - Zheludev, Nikolay I.

AU - Dholakia, Kishan

N1 - Funding Information: We thank the UK Engineering and Physical Sciences Research Council for funding (grant EP/F040644/1) and Mark Dennis for helpful discussions. K.D. is a Royal Society Wolfson Merit Award Holder.

PY - 2011/5/2

Y1 - 2011/5/2

N2 - We report the focusing of light to generate a subdiffractive, subwavelength focal spot of full width half maximum 222 nm at an operating wavelength of 633 nm using an optical eigenmode approach. Crucially, the spot is created in the focal plane of a microscope objective thus yielding a practical working distance for applications. The optical eigenmode approach is implemented using an optimal superposition of Bessel beams on a spatial light modulator. The effects of partial coherence are also discussed. This far field method is a key advance toward the generation of subdiffractive optical features for imaging and lithographic purposes.

AB - We report the focusing of light to generate a subdiffractive, subwavelength focal spot of full width half maximum 222 nm at an operating wavelength of 633 nm using an optical eigenmode approach. Crucially, the spot is created in the focal plane of a microscope objective thus yielding a practical working distance for applications. The optical eigenmode approach is implemented using an optimal superposition of Bessel beams on a spatial light modulator. The effects of partial coherence are also discussed. This far field method is a key advance toward the generation of subdiffractive optical features for imaging and lithographic purposes.

UR - http://www.scopus.com/inward/record.url?scp=79957440101&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79957440101&partnerID=8YFLogxK

U2 - 10.1063/1.3587636

DO - 10.1063/1.3587636

M3 - Article

AN - SCOPUS:79957440101

SN - 0003-6951

VL - 98

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 18

M1 - 181109

ER -

Far field subwavelength focusing using optical eigenmodes

Abstract

Bibliographical note

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this