Fabrication and characterization of microstructural evolution and properties of twisted Bi(Pb)-Sr-Ca-Cu-O superconductor tape

Jun Hyung Lim; Jinho Joo; Jung Gu Kim; Wansoo Nah; Mihye Jang; Taekuk Ko; Sang Jin Lee; Hong Soo Ha; Sang Soo Oh; Young Kil Kwon

doi:10.1109/77.919644

Fabrication and characterization of microstructural evolution and properties of twisted Bi(Pb)-Sr-Ca-Cu-O superconductor tape

Jun Hyung Lim, Jinho Joo, Jung Gu Kim, Wansoo Nah, Mihye Jang, Taekuk Ko, Sang Jin Lee, Hong Soo Ha, Sang Soo Oh, Young Kil Kwon

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Conference article › peer-review

1 Citation (Scopus)

Abstract

We fabricated 37 multi-filament Bi-2223 (BSCCO) superconductor tapes and evaluated the effect of twisting on the microstructural evolution such as grain size, grain alignment, and interface morphology, and on the resulting critical current. Twist pitches of the BSCCO tapes are in the range of 70 to 8 mm and uniformly deformed. It was observed that the grain size and the degree of texture decreased with decreasing pitch, probably due to the formation of the irregular interface between the Ag and the filaments. In addition, the critical current of the tapes decreased with decreasing pitch. For the tape having a twist pitch of 8 mm, approximately 50% of the critical current was maintained compared to that of the untwisted tape. The reduction of critical current may be related to the interface irregularity, smaller grain size, poorer texture and presence of cracks due to the induced strain during the twisting processing.

Original language	English
Pages (from-to)	2796-2799
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	11
Issue number	1 III
DOIs	https://doi.org/10.1109/77.919644
Publication status	Published - 2001 Mar
Event	2000 Applied Superconductivity Conference - Virginia Beach, VA, United States Duration: 2000 Sept 17 → 2000 Sept 22

Bibliographical note

Funding Information:
Manuscript received August 17, 2000. This wok was fmancially supported by the Korea Research Foundation Jun Hyung Lim, Jinho Joo and Jung-Gu Kim are with school of Metallurgical and Materials Engineering, Sungkyunkwan University, Suwon, Kyounggi, 440-746, Korea (email: ,iinho@,skku.ac.kr) Wansoo Nah is with school of Electrical and Computer Engineering Sungkyunkwan University, Suwon, Kyounggi, 440-746, Korea Mihye Jang and Taekuk KO are with school of Mechanical and Electronic Eng., Yonsei Univmity, Seoul, Korea Sang-Jin Lee is with Uiduk University, Dept. of Elffitrical Eng., Kangdong, Kyongju, Korea Hong-Soo Ha, Sang-Soo Oh, and Young-Kil Kwon are with Applied Superconductivity Laboratory, Korea Electroteohnology Research Institute, Chang-won, 305-600, Korea

Funding Information:
The authors wish to acknowledge the financial support of the Korea Research Foundation made in the program year of (1999)

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/77.919644

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@article{678eef1ef32a4d0f94704a77236f279d,

title = "Fabrication and characterization of microstructural evolution and properties of twisted Bi(Pb)-Sr-Ca-Cu-O superconductor tape",

abstract = "We fabricated 37 multi-filament Bi-2223 (BSCCO) superconductor tapes and evaluated the effect of twisting on the microstructural evolution such as grain size, grain alignment, and interface morphology, and on the resulting critical current. Twist pitches of the BSCCO tapes are in the range of 70 to 8 mm and uniformly deformed. It was observed that the grain size and the degree of texture decreased with decreasing pitch, probably due to the formation of the irregular interface between the Ag and the filaments. In addition, the critical current of the tapes decreased with decreasing pitch. For the tape having a twist pitch of 8 mm, approximately 50% of the critical current was maintained compared to that of the untwisted tape. The reduction of critical current may be related to the interface irregularity, smaller grain size, poorer texture and presence of cracks due to the induced strain during the twisting processing.",

author = "Lim, {Jun Hyung} and Jinho Joo and Kim, {Jung Gu} and Wansoo Nah and Mihye Jang and Taekuk Ko and Lee, {Sang Jin} and Ha, {Hong Soo} and Oh, {Sang Soo} and Kwon, {Young Kil}",

note = "Funding Information: Manuscript received August 17, 2000. This wok was fmancially supported by the Korea Research Foundation Jun Hyung Lim, Jinho Joo and Jung-Gu Kim are with school of Metallurgical and Materials Engineering, Sungkyunkwan University, Suwon, Kyounggi, 440-746, Korea (email: ,iinho@,skku.ac.kr) Wansoo Nah is with school of Electrical and Computer Engineering Sungkyunkwan University, Suwon, Kyounggi, 440-746, Korea Mihye Jang and Taekuk KO are with school of Mechanical and Electronic Eng., Yonsei Univmity, Seoul, Korea Sang-Jin Lee is with Uiduk University, Dept. of Elffitrical Eng., Kangdong, Kyongju, Korea Hong-Soo Ha, Sang-Soo Oh, and Young-Kil Kwon are with Applied Superconductivity Laboratory, Korea Electroteohnology Research Institute, Chang-won, 305-600, Korea Funding Information: The authors wish to acknowledge the financial support of the Korea Research Foundation made in the program year of (1999); 2000 Applied Superconductivity Conference ; Conference date: 17-09-2000 Through 22-09-2000",

year = "2001",

month = mar,

doi = "10.1109/77.919644",

language = "English",

volume = "11",

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T1 - Fabrication and characterization of microstructural evolution and properties of twisted Bi(Pb)-Sr-Ca-Cu-O superconductor tape

AU - Lim, Jun Hyung

AU - Joo, Jinho

AU - Kim, Jung Gu

AU - Nah, Wansoo

AU - Jang, Mihye

AU - Ko, Taekuk

AU - Lee, Sang Jin

AU - Ha, Hong Soo

AU - Oh, Sang Soo

AU - Kwon, Young Kil

N1 - Funding Information: Manuscript received August 17, 2000. This wok was fmancially supported by the Korea Research Foundation Jun Hyung Lim, Jinho Joo and Jung-Gu Kim are with school of Metallurgical and Materials Engineering, Sungkyunkwan University, Suwon, Kyounggi, 440-746, Korea (email: ,iinho@,skku.ac.kr) Wansoo Nah is with school of Electrical and Computer Engineering Sungkyunkwan University, Suwon, Kyounggi, 440-746, Korea Mihye Jang and Taekuk KO are with school of Mechanical and Electronic Eng., Yonsei Univmity, Seoul, Korea Sang-Jin Lee is with Uiduk University, Dept. of Elffitrical Eng., Kangdong, Kyongju, Korea Hong-Soo Ha, Sang-Soo Oh, and Young-Kil Kwon are with Applied Superconductivity Laboratory, Korea Electroteohnology Research Institute, Chang-won, 305-600, Korea Funding Information: The authors wish to acknowledge the financial support of the Korea Research Foundation made in the program year of (1999)

PY - 2001/3

Y1 - 2001/3

N2 - We fabricated 37 multi-filament Bi-2223 (BSCCO) superconductor tapes and evaluated the effect of twisting on the microstructural evolution such as grain size, grain alignment, and interface morphology, and on the resulting critical current. Twist pitches of the BSCCO tapes are in the range of 70 to 8 mm and uniformly deformed. It was observed that the grain size and the degree of texture decreased with decreasing pitch, probably due to the formation of the irregular interface between the Ag and the filaments. In addition, the critical current of the tapes decreased with decreasing pitch. For the tape having a twist pitch of 8 mm, approximately 50% of the critical current was maintained compared to that of the untwisted tape. The reduction of critical current may be related to the interface irregularity, smaller grain size, poorer texture and presence of cracks due to the induced strain during the twisting processing.

AB - We fabricated 37 multi-filament Bi-2223 (BSCCO) superconductor tapes and evaluated the effect of twisting on the microstructural evolution such as grain size, grain alignment, and interface morphology, and on the resulting critical current. Twist pitches of the BSCCO tapes are in the range of 70 to 8 mm and uniformly deformed. It was observed that the grain size and the degree of texture decreased with decreasing pitch, probably due to the formation of the irregular interface between the Ag and the filaments. In addition, the critical current of the tapes decreased with decreasing pitch. For the tape having a twist pitch of 8 mm, approximately 50% of the critical current was maintained compared to that of the untwisted tape. The reduction of critical current may be related to the interface irregularity, smaller grain size, poorer texture and presence of cracks due to the induced strain during the twisting processing.

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VL - 11

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EP - 2799

JO - IEEE Transactions on Applied Superconductivity

JF - IEEE Transactions on Applied Superconductivity

IS - 1 III

T2 - 2000 Applied Superconductivity Conference

Y2 - 17 September 2000 through 22 September 2000

ER -

Fabrication and characterization of microstructural evolution and properties of twisted Bi(Pb)-Sr-Ca-Cu-O superconductor tape

Abstract

Bibliographical note

All Science Journal Classification (ASJC) codes

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