Experimental and theoretical study of parasitic leakage/resonance in a K/KA-Band MMIC package

Jong Gwan Yook; Linda P.B. Katehi; Rainée N. Simons; Kurt A. Shalkhauser

doi:10.1109/22.554569

Experimental and theoretical study of parasitic leakage/resonance in a K/KA-Band MMIC package

Jong Gwan Yook, Linda P.B. Katehi, Rainée N. Simons, Kurt A. Shalkhauser

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

18 Citations (Scopus)

Abstract

In this paper, electromagnetic (EM) leakage and spurious resonances in a K/Ka-Band (18-40 GHz) MMIC hermetic package designed for a phase shifter chip are studied using the finite element method (FEM) and the numerical simulation results are compared with the measured data. Both the measured and calculated data indicate several spurious resonances in the 18-24 GHz region and the origin of this phenomenon is identified by virtue of the modeling capability of the FEM. Moreover, the effect of dc bias lines, bond wires, shielding, and the asymmetry of the package on electrical performance are closely examined. In addition, the effect of adding a resistive Coating to the inside surface of the package lid and also the use of dielectric packaging materials with very high loss tangent are studied in view of the suppression of the spurious resonances. Finally, design guidelines for the improved package are presented.

Original language	English
Pages (from-to)	2403-2410
Number of pages	8
Journal	IEEE Transactions on Microwave Theory and Techniques
Volume	44
Issue number	12 PART 2
DOIs	https://doi.org/10.1109/22.554569
Publication status	Published - 1996

Bibliographical note

Funding Information:
Manuscript received March 27, 1966. This work was supported in part by NASA Lewis Research Center under Grant NAG-1807, NSF Grant CDA-92-14 296, and the Ford Motor Company. J.-G. Yook and L. P. B. Katehi are with the Radiation Laboratory, Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI 48109-2122 USA. R. N. Simons is with the NASA Lewis Research Center, NYMA Group, Cleveland, OH 44135 USA. K. A. Shalkhauser is with the NASA Lewis Research Center, Cleveland, OH 44135 USA. Publisher Item Identifier S 0018-9480(96)08544-4.

All Science Journal Classification (ASJC) codes

Radiation
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/22.554569

Cite this

@article{dc2f9a4a3deb4f0d90774b9756290b2b,

title = "Experimental and theoretical study of parasitic leakage/resonance in a K/KA-Band MMIC package",

abstract = "In this paper, electromagnetic (EM) leakage and spurious resonances in a K/Ka-Band (18-40 GHz) MMIC hermetic package designed for a phase shifter chip are studied using the finite element method (FEM) and the numerical simulation results are compared with the measured data. Both the measured and calculated data indicate several spurious resonances in the 18-24 GHz region and the origin of this phenomenon is identified by virtue of the modeling capability of the FEM. Moreover, the effect of dc bias lines, bond wires, shielding, and the asymmetry of the package on electrical performance are closely examined. In addition, the effect of adding a resistive Coating to the inside surface of the package lid and also the use of dielectric packaging materials with very high loss tangent are studied in view of the suppression of the spurious resonances. Finally, design guidelines for the improved package are presented.",

author = "Yook, {Jong Gwan} and Katehi, {Linda P.B.} and Simons, {Rain{\'e}e N.} and Shalkhauser, {Kurt A.}",

note = "Funding Information: Manuscript received March 27, 1966. This work was supported in part by NASA Lewis Research Center under Grant NAG-1807, NSF Grant CDA-92-14 296, and the Ford Motor Company. J.-G. Yook and L. P. B. Katehi are with the Radiation Laboratory, Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI 48109-2122 USA. R. N. Simons is with the NASA Lewis Research Center, NYMA Group, Cleveland, OH 44135 USA. K. A. Shalkhauser is with the NASA Lewis Research Center, Cleveland, OH 44135 USA. Publisher Item Identifier S 0018-9480(96)08544-4.",

year = "1996",

doi = "10.1109/22.554569",

language = "English",

volume = "44",

pages = "2403--2410",

journal = "IEEE Transactions on Microwave Theory and Techniques",

issn = "0018-9480",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "12 PART 2",

}

TY - JOUR

T1 - Experimental and theoretical study of parasitic leakage/resonance in a K/KA-Band MMIC package

AU - Yook, Jong Gwan

AU - Katehi, Linda P.B.

AU - Simons, Rainée N.

AU - Shalkhauser, Kurt A.

N1 - Funding Information: Manuscript received March 27, 1966. This work was supported in part by NASA Lewis Research Center under Grant NAG-1807, NSF Grant CDA-92-14 296, and the Ford Motor Company. J.-G. Yook and L. P. B. Katehi are with the Radiation Laboratory, Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI 48109-2122 USA. R. N. Simons is with the NASA Lewis Research Center, NYMA Group, Cleveland, OH 44135 USA. K. A. Shalkhauser is with the NASA Lewis Research Center, Cleveland, OH 44135 USA. Publisher Item Identifier S 0018-9480(96)08544-4.

PY - 1996

Y1 - 1996

N2 - In this paper, electromagnetic (EM) leakage and spurious resonances in a K/Ka-Band (18-40 GHz) MMIC hermetic package designed for a phase shifter chip are studied using the finite element method (FEM) and the numerical simulation results are compared with the measured data. Both the measured and calculated data indicate several spurious resonances in the 18-24 GHz region and the origin of this phenomenon is identified by virtue of the modeling capability of the FEM. Moreover, the effect of dc bias lines, bond wires, shielding, and the asymmetry of the package on electrical performance are closely examined. In addition, the effect of adding a resistive Coating to the inside surface of the package lid and also the use of dielectric packaging materials with very high loss tangent are studied in view of the suppression of the spurious resonances. Finally, design guidelines for the improved package are presented.

AB - In this paper, electromagnetic (EM) leakage and spurious resonances in a K/Ka-Band (18-40 GHz) MMIC hermetic package designed for a phase shifter chip are studied using the finite element method (FEM) and the numerical simulation results are compared with the measured data. Both the measured and calculated data indicate several spurious resonances in the 18-24 GHz region and the origin of this phenomenon is identified by virtue of the modeling capability of the FEM. Moreover, the effect of dc bias lines, bond wires, shielding, and the asymmetry of the package on electrical performance are closely examined. In addition, the effect of adding a resistive Coating to the inside surface of the package lid and also the use of dielectric packaging materials with very high loss tangent are studied in view of the suppression of the spurious resonances. Finally, design guidelines for the improved package are presented.

UR - http://www.scopus.com/inward/record.url?scp=0030408837&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0030408837&partnerID=8YFLogxK

U2 - 10.1109/22.554569

DO - 10.1109/22.554569

M3 - Article

AN - SCOPUS:0030408837

SN - 0018-9480

VL - 44

SP - 2403

EP - 2410

JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

IS - 12 PART 2

ER -

Experimental and theoretical study of parasitic leakage/resonance in a K/KA-Band MMIC package

Abstract

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