Experimental and theoretical analysis of degradation in Ga ₂O₃-In₂O₃-ZnO thin-film transistors

Engineering

• Gate Voltage 100%
• Thin-Film Transistor 80%
• Drain Voltage 60%
• Experimental Result 20%
• Joule 20%
• Current Drain 20%
• Density of State 20%
• Stress Condition 20%
• Networks (Circuits) 20%
• Degradation Mechanism 20%
• State Model 20%
• Heating 20%
• Density 20%
• Properties 20%
• Simulation 20%

Computer Science

• Experimental Result 20%
• Threshold Voltage 20%
• Density of State 20%
• Generation 20%
• Simulation 20%

Material Science

• ZnO 40%
• Devices 20%