Erratum: Characterization of CF4 plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814))

Sung Jin Jo; Chang Su Kim; Seung Yoon Ryu; Jong Bok Kim; Joo Hyon Noh; Se Jong Lee; Hong Koo Baik

doi:10.1143/JJAP.47.404

Erratum: Characterization of CF₄ plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814))

Sung Jin Jo, Chang Su Kim, Seung Yoon Ryu, Jong Bok Kim, Joo Hyon Noh, Se Jong Lee, Hong Koo Baik

Department of Materials Science and Engineering

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English
Pages (from-to)	404
Number of pages	1
Journal	Japanese journal of applied physics
Volume	47
Issue number	1
DOIs	https://doi.org/10.1143/JJAP.47.404
Publication status	Published - 2008 Jan 18

All Science Journal Classification (ASJC) codes

Engineering(all)
Physics and Astronomy(all)

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10.1143/JJAP.47.404

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Jo, S. J., Kim, C. S., Ryu, S. Y., Kim, J. B., Noh, J. H., Lee, S. J., & Baik, H. K. (2008). Erratum: Characterization of CF₄ plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814)). Japanese journal of applied physics, 47(1), 404. https://doi.org/10.1143/JJAP.47.404

@article{316af533ce4d4005949fe58bdb80d933,

title = "Erratum: Characterization of CF4 plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814))",

author = "Jo, {Sung Jin} and Kim, {Chang Su} and Ryu, {Seung Yoon} and Kim, {Jong Bok} and Noh, {Joo Hyon} and Lee, {Se Jong} and Baik, {Hong Koo}",

year = "2008",

month = jan,

day = "18",

doi = "10.1143/JJAP.47.404",

language = "English",

volume = "47",

pages = "404",

journal = "Japanese Journal of Applied Physics",

issn = "0021-4922",

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}

Jo, SJ, Kim, CS, Ryu, SY, Kim, JB, Noh, JH, Lee, SJ & Baik, HK 2008, 'Erratum: Characterization of CF₄ plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814))', Japanese journal of applied physics, vol. 47, no. 1, pp. 404. https://doi.org/10.1143/JJAP.47.404

Erratum: Characterization of CF₄ plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814)). / Jo, Sung Jin; Kim, Chang Su; Ryu, Seung Yoon et al.
In: Japanese journal of applied physics, Vol. 47, No. 1, 18.01.2008, p. 404.

Research output: Contribution to journal › Comment/debate › peer-review

TY - JOUR

T1 - Erratum

T2 - Characterization of CF4 plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814))

AU - Jo, Sung Jin

AU - Kim, Chang Su

AU - Ryu, Seung Yoon

AU - Kim, Jong Bok

AU - Noh, Joo Hyon

AU - Lee, Se Jong

AU - Baik, Hong Koo

PY - 2008/1/18

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U2 - 10.1143/JJAP.47.404

DO - 10.1143/JJAP.47.404

M3 - Comment/debate

AN - SCOPUS:38549167118

SN - 0021-4922

VL - 47

SP - 404

JO - Japanese Journal of Applied Physics

JF - Japanese Journal of Applied Physics

IS - 1

ER -

Erratum: Characterization of CF4 plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814))

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Erratum: Characterization of CF₄ plasma-treated indium-tin-oxide surfaces used in organic light-emitting diodes by X-ray photoemission spectroscopy (Japanese Journal of Applied Physics (2007) 46 (6814))