EPINET: A Fully-Convolutional Neural Network Using Epipolar Geometry for Depth from Light Field Images

Changha Shin, Hae Gon Jeon, Youngjin Yoon, In So Kweon, Seon Joo Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

177 Citations (Scopus)

Abstract

Light field cameras capture both the spatial and the angular properties of light rays in space. Due to its property, one can compute the depth from light fields in uncontrolled lighting environments, which is a big advantage over active sensing devices. Depth computed from light fields can be used for many applications including 3D modelling and refocusing. However, light field images from hand-held cameras have very narrow baselines with noise, making the depth estimation difficult. Many approaches have been proposed to overcome these limitations for the light field depth estimation, but there is a clear trade-off between the accuracy and the speed in these methods. In this paper, we introduce a fast and accurate light field depth estimation method based on a fully-convolutional neural network. Our network is designed by considering the light field geometry and we also overcome the lack of training data by proposing light field specific data augmentation methods. We achieved the top rank in the HCI 4D Light Field Benchmark on most metrics, and we also demonstrate the effectiveness of the proposed method on real-world light-field images.

Original languageEnglish
Title of host publicationProceedings - 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2018
PublisherIEEE Computer Society
Pages4748-4757
Number of pages10
ISBN (Electronic)9781538664209
DOIs
Publication statusPublished - 2018 Dec 14
Event31st Meeting of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2018 - Salt Lake City, United States
Duration: 2018 Jun 182018 Jun 22

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
ISSN (Print)1063-6919

Conference

Conference31st Meeting of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2018
Country/TerritoryUnited States
CitySalt Lake City
Period18/6/1818/6/22

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

All Science Journal Classification (ASJC) codes

  • Software
  • Computer Vision and Pattern Recognition

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