Enhenced redundancy analysis for memories using geometric faults based search tree

Wooheon Kang, Hyungjun Cho, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

With the growth of memory capacity and density, test cost and yield improvement are becoming more important. To increase yield of memory, redundancy analysis (RA) which analyzes the faults in memory is essential. However, the time for finding solutions to repair memories with faulty cells is very huge because most RA algorithms for automatic test equipment (ATE) are based on a tree structure. To reduce the time of memory test & repair is important to increase the memory yield using ATE. In order to reduce the time of memory test & repair, an RA algorithm with an early termination condition is proposed and it builds a geometric faults based search tree. To build the proposed algorithm, the faults in a memory are classified into geometric faults according to their characteristic. The experimental results show the effectiveness of the proposed algorithm.

Original languageEnglish
Title of host publication2010 International SoC Design Conference, ISOCC 2010
Pages225-228
Number of pages4
DOIs
Publication statusPublished - 2010
Event2010 International SoC Design Conference, ISOCC 2010 - Incheon, Korea, Republic of
Duration: 2010 Nov 222010 Nov 23

Publication series

Name2010 International SoC Design Conference, ISOCC 2010

Other

Other2010 International SoC Design Conference, ISOCC 2010
Country/TerritoryKorea, Republic of
CityIncheon
Period10/11/2210/11/23

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture

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