Enhancing Test Compression with Dependency Analysis for Multiple Expansion Ratios

Taehee Lee; Nur A. Touba; Joon Sung Yang

doi:10.1109/TCAD.2017.2681063

Enhancing Test Compression with Dependency Analysis for Multiple Expansion Ratios

Taehee Lee, Nur A. Touba, Joon Sung Yang

College of Engineering

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

Scan test data compression is widely used in industry to reduce test data volume (TDV) and test application time (TAT). This paper shows how multiple scan chain expansion ratios can help to obtain high test data compression in system-on-chips. Scan chains are partitioned with a higher expansion ratio than normal in scan compression mode and then are gradually concatenated based on a cost function to detect any faults that could not be detected at the higher expansion ratios. It improves the overall test compression ratio since it potentially allows faults to be detected at the highest expansion ratio. This paper introduces a new cost function to choose scan chain concatenation candidates for concatenation for multiple expansion ratios. To avoid TDV and TAT increase by scan concatenation, the proposed method takes a logic structure and scan chain length into consideration. Experiment results show the proposed method reduces TAT and TDV by 53%-64% compared with a traditional scan compression method.

Original language	English
Article number	7875484
Pages (from-to)	1571-1579
Number of pages	9
Journal	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume	36
Issue number	9
DOIs	https://doi.org/10.1109/TCAD.2017.2681063
Publication status	Published - 2017 Sept

Bibliographical note

Funding Information:
Manuscript received May 15, 2016; revised August 9, 2016; accepted October 11, 2016. Date of publication March 10, 2017; date of current version August 18, 2017. This work was supported in part by the Basic Science Research Program through the National Research Foundation of Korea by the Ministry of Education under Grant NRF-2015R1D1A1A01058856, in part by the Korea Institute for Advancement of Technology (KIAT) by the Korean Government (Motie:Ministry of Trade, Industry & Energy, HRD Program for Software-SoC Convergence) under Grant N0001883, in part by Samsung Research Fund, and in part by the National Science Foundation under Grant CCF-1617665. This paper was recommended by Associate Editor N. Nicolici.

Publisher Copyright:
© 1982-2012 IEEE.

All Science Journal Classification (ASJC) codes

Software
Computer Graphics and Computer-Aided Design
Electrical and Electronic Engineering

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10.1109/TCAD.2017.2681063

Cite this

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abstract = "Scan test data compression is widely used in industry to reduce test data volume (TDV) and test application time (TAT). This paper shows how multiple scan chain expansion ratios can help to obtain high test data compression in system-on-chips. Scan chains are partitioned with a higher expansion ratio than normal in scan compression mode and then are gradually concatenated based on a cost function to detect any faults that could not be detected at the higher expansion ratios. It improves the overall test compression ratio since it potentially allows faults to be detected at the highest expansion ratio. This paper introduces a new cost function to choose scan chain concatenation candidates for concatenation for multiple expansion ratios. To avoid TDV and TAT increase by scan concatenation, the proposed method takes a logic structure and scan chain length into consideration. Experiment results show the proposed method reduces TAT and TDV by 53%-64% compared with a traditional scan compression method.",

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note = "Funding Information: Manuscript received May 15, 2016; revised August 9, 2016; accepted October 11, 2016. Date of publication March 10, 2017; date of current version August 18, 2017. This work was supported in part by the Basic Science Research Program through the National Research Foundation of Korea by the Ministry of Education under Grant NRF-2015R1D1A1A01058856, in part by the Korea Institute for Advancement of Technology (KIAT) by the Korean Government (Motie:Ministry of Trade, Industry & Energy, HRD Program for Software-SoC Convergence) under Grant N0001883, in part by Samsung Research Fund, and in part by the National Science Foundation under Grant CCF-1617665. This paper was recommended by Associate Editor N. Nicolici. Publisher Copyright: {\textcopyright} 1982-2012 IEEE.",

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Enhancing Test Compression with Dependency Analysis for Multiple Expansion Ratios

Abstract

Bibliographical note

All Science Journal Classification (ASJC) codes

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