Abstract
The element and orbital-specific electronic structure of thin films of the organic material N,N′-ethylene-bis(1,1,1-trifluoropentane-2,4- dioneiminato)-copper(ii) (designated as Cu-TFAC) has been studied using a combination of synchrotron radiation-excited resonant X-ray emission spectroscopy, X-ray photoelectron spectroscopy, X-ray absorption spectroscopy and density functional theory calculations. Furthermore, resonant X-ray emission at the carbon K-edge was used to measure the density of states for individual C sites in the molecule.
Original language | English |
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Pages (from-to) | 3171-3177 |
Number of pages | 7 |
Journal | Physical Chemistry Chemical Physics |
Volume | 12 |
Issue number | 13 |
DOIs | |
Publication status | Published - 2010 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)
- Physical and Theoretical Chemistry