Electronic structure of ClAlPc/pentacene/ITO interfaces studied by using soft X-ray spectroscopy

Sang Wan Cho, Sangho Lee, Minsoo Kim, Nari Heo, Geunjeong Lee, Kevin E. Smith

Research output: Contribution to journalArticlepeer-review


The interfacial electronic structure of a bilayer of chloroaluminum phthalocyanine (ClAlPc) and pentacene grown on indium tin oxide (ITO) has been studied using synchrotron-radiation-excited photoelectron spectroscopy. The energy difference between the highest occupied molecular orbital (HOMO) level of the pentacene layer and the lowest unoccupied molecular orbital (LUMO) level of the ClAlPc layer (EHOMO D − ELUMO A) was determined and compared with that of C60/pentacene bilayers. The EHOMO D − ELUMO A of a heterojunction with ClAlPc was found to be 1.3 eV while that with C60 was 0.9 eV. This difference is discussed in terms of the difference in the ionization energy of each acceptor materials. We also obtained the complete energy level diagrams of both ClAlPc/pentacene/ITO and C60/pentacene/ITO.

Original languageEnglish
Pages (from-to)1629-1633
Number of pages5
JournalJournal of the Korean Physical Society
Issue number10
Publication statusPublished - 2014 Dec 6

Bibliographical note

Publisher Copyright:
© 2014, The Korean Physical Society.

All Science Journal Classification (ASJC) codes

  • General Physics and Astronomy


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