Electronic and structural characteristics of Zr-incorporated Gd2 O3 films on strained SiGe substrates

J. H. Baeck, S. A. Park, W. J. Lee, I. S. Jeong, K. Jeong, M. H. Cho, Y. K. Kim, B. G. Min, D. H. Ko

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

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