Fingerprint
Dive into the research topics of 'Electrical properties and thermal stability in stack structure of HfO2/Al2O3/InSb by atomic layer deposition'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Electrical properties and thermal stability in stack structure of HfO2/Al2O3/InSb by atomic layer deposition
Min Baik, Hang Kyu Kang, Yu Seon Kang, Kwang Sik Jeong, Youngseo An, Seongheum Choi, Hyoungsub Kim, Jin Dong Song, Mann Ho Cho
Research output: Contribution to journal › Article › peer-review
13
Citations
(Scopus)