Abstract
Several companies in the world are marketing super-conducting products, such as wires, films, and bulk, and so on. High-Tc superconducting (HTS) systems have begun to be commercialized with these HTS products, and the demand for them Is increasing. A database on the electrical degradation of high-Tc superconductors Is an essential requirement to commercialize HTS systems. The electrical degradation of Bi-2223 wire has been investigated in this paper. To simulate the conditions of real systems, two types of specimens were prepared. One was named Ring Specimen with Bi-2223 wire on a bobbin of 400 mm diameter and the other was named Double-Pancake Specimen with BI-2223 wire coiled on a bobbin of 100 mm diameter. The Bi-2223 wire of the Double -Pancake Specimen was coiled with several winding tensions. The continuous current transport method was used for the measurement of the electrical degradation. Various levels of transport current were applied to each conductor. The levels are 90, 95, 98, and 110% of the critical current (Ic) in Ring Specimens and 95 and 150% in Double-Pancake Specimens. Although a difference of the Ic in the long Bi-2223 wire was found, there was not any severe degradation in the Ring Specimens. When the level of transport current was below the critical current, degradation did not appear in the Double-Pancake Specimens either. However, they degraded very quickly when the level of transport current was 150% of Ic.
Original language | English |
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Pages (from-to) | 2949-2952 |
Number of pages | 4 |
Journal | IEEE Transactions on Applied Superconductivity |
Volume | 13 |
Issue number | 2 III |
DOIs | |
Publication status | Published - 2003 Jun |
Event | 2002 Applied Superconductivity Conference - Houston, TX, United States Duration: 2002 Aug 4 → 2002 Aug 9 |
Bibliographical note
Funding Information:Manuscript received August 6, 2002. This work was supported by a grant from the Center for Applied Superconductivity Technology of the 21st Century Frontier R&D Program through the Ministry of Science and Technology, Republic of Korea. D. K. Bae and T. K. Ko are with the Department of Electrical and Electronic Engineering, Yonsei University, Seoul, 120-749, Korea (e-mail: porthos@yonsei.ac.kr, tkko@yonsei.ac.kr). S.-J. Lee is with the Department of Electrical Engineering, Uiduk University, Kyongju 780-713, Korea (e-mail: sjlee@uiduck.ac.kr). J. H. Bae, K. D. Sim, and K. Y. Park are with the Korea Electrotechnology Research Institute, Changwon 641-120, Korea (e-mail: baejh@keri.re.kr). Digital Object Identifier 10.1109/TASC.2003.812066
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering