Efficient test generation algorithm for path delay faults

Myoung Gyun Kim; Sungho Kang

doi:10.1049/el:20000043

Efficient test generation algorithm for path delay faults

Myoung Gyun Kim, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

A new algorithm has been developed to perform efficient delay testing. The algorithm enables applications of a new implication of value using indirect implication. The results of ISCAS benchmark circuits show the effectiveness of the new algorithm.

Original language	English
Pages (from-to)	13-14
Number of pages	2
Journal	Electronics Letters
Volume	36
Issue number	1
DOIs	https://doi.org/10.1049/el:20000043
Publication status	Published - 2000 Jan 6

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

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10.1049/el:20000043

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Efficient test generation algorithm for path delay faults

Abstract

All Science Journal Classification (ASJC) codes

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