Efficient redundancy identification for test pattern generation

Sangyun Han; Sungho Kang

Efficient redundancy identification for test pattern generation

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Conference article › peer-review

Abstract

Due to the reconvergent fanouts which make the dependency among objectives and block the fault propagation, there may exist redundant faults in the circuits. This paper presents the isomorphism identification algorithm and the pseudo dominator algorithm which are used to identify redundant faults. Experimental results on ISCAS 85 benchmark circuits show that these algorithms are efficient to identify redundant faults.

Original language	English
Pages (from-to)	52-56
Number of pages	5
Journal	Proceedings of the Annual IEEE International ASIC Conference and Exhibit
Publication status	Published - 1997
Event	Proceedings of the 1997 10th Annual IEEE International ASIC Conference and Exhibit - Portland, OR, USA Duration: 1997 Sept 7 → 1997 Sept 10

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Cite this

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title = "Efficient redundancy identification for test pattern generation",

abstract = "Due to the reconvergent fanouts which make the dependency among objectives and block the fault propagation, there may exist redundant faults in the circuits. This paper presents the isomorphism identification algorithm and the pseudo dominator algorithm which are used to identify redundant faults. Experimental results on ISCAS 85 benchmark circuits show that these algorithms are efficient to identify redundant faults.",

author = "Sangyun Han and Sungho Kang",

year = "1997",

language = "English",

pages = "52--56",

journal = "Proceedings of the Annual IEEE International ASIC Conference and Exhibit",

issn = "1063-0988",

note = "Proceedings of the 1997 10th Annual IEEE International ASIC Conference and Exhibit ; Conference date: 07-09-1997 Through 10-09-1997",

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T1 - Efficient redundancy identification for test pattern generation

AU - Han, Sangyun

AU - Kang, Sungho

PY - 1997

Y1 - 1997

N2 - Due to the reconvergent fanouts which make the dependency among objectives and block the fault propagation, there may exist redundant faults in the circuits. This paper presents the isomorphism identification algorithm and the pseudo dominator algorithm which are used to identify redundant faults. Experimental results on ISCAS 85 benchmark circuits show that these algorithms are efficient to identify redundant faults.

AB - Due to the reconvergent fanouts which make the dependency among objectives and block the fault propagation, there may exist redundant faults in the circuits. This paper presents the isomorphism identification algorithm and the pseudo dominator algorithm which are used to identify redundant faults. Experimental results on ISCAS 85 benchmark circuits show that these algorithms are efficient to identify redundant faults.

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M3 - Conference article

AN - SCOPUS:0030655973

SN - 1063-0988

SP - 52

EP - 56

JO - Proceedings of the Annual IEEE International ASIC Conference and Exhibit

JF - Proceedings of the Annual IEEE International ASIC Conference and Exhibit

T2 - Proceedings of the 1997 10th Annual IEEE International ASIC Conference and Exhibit

Y2 - 7 September 1997 through 10 September 1997

ER -

Efficient redundancy identification for test pattern generation

Abstract

All Science Journal Classification (ASJC) codes

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