Efficient interconnect test using BIST module in a boundary-scan environment

Engineering

• Algorithm 50%
• Boundary Scan 50%
• Built-in Self Test 100%
• Chains 25%
• Environment 25%
• Interconnects 50%
• Modules 50%
• Test Data 25%

Earth and Planetary Sciences

• Algorithms 50%
• Chain 25%
• Collision 25%
• Environment 25%
• Flexibility 25%
• Module 50%
• State 25%

Physics

• Algorithms 50%
• Collisions 25%
• Environment 25%
• Flexibility 25%