Efficient interconnect test using BIST module in a boundary-scan environment

Hyun Jin Kim, Jongchul Shin, Sungho Kang

Research output: Contribution to conferencePaperpeer-review


In this paper, an efficient BIST method for applying tests is developed without collisions of the test data in 3-state nets in a system. A new interconnect test algorithm in multiple boundary scan chains and the BIST module based on the new BIST method are presented. The new algorithm can be easily applied to any net configurations with high flexibility.

Original languageEnglish
Number of pages2
Publication statusPublished - 1999
EventInternational Conference on Computer Design (ICCD'99) - Austin, TX, USA
Duration: 1999 Oct 101999 Oct 13


OtherInternational Conference on Computer Design (ICCD'99)
CityAustin, TX, USA

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering


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