Efficient interconnect test using BIST module in a boundary-scan environment

Hyun Jin Kim; Jongchul Shin; Sungho Kang

Efficient interconnect test using BIST module in a boundary-scan environment

Hyun Jin Kim, Jongchul Shin, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Contribution to conference › Paper › peer-review

Abstract

In this paper, an efficient BIST method for applying tests is developed without collisions of the test data in 3-state nets in a system. A new interconnect test algorithm in multiple boundary scan chains and the BIST module based on the new BIST method are presented. The new algorithm can be easily applied to any net configurations with high flexibility.

Original language	English
Pages	328-329
Number of pages	2
Publication status	Published - 1999
Event	International Conference on Computer Design (ICCD'99) - Austin, TX, USA Duration: 1999 Oct 10 → 1999 Oct 13

Other

Other	International Conference on Computer Design (ICCD'99)
City	Austin, TX, USA
Period	99/10/10 → 99/10/13

All Science Journal Classification (ASJC) codes

Hardware and Architecture
Electrical and Electronic Engineering

Cite this

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title = "Efficient interconnect test using BIST module in a boundary-scan environment",

abstract = "In this paper, an efficient BIST method for applying tests is developed without collisions of the test data in 3-state nets in a system. A new interconnect test algorithm in multiple boundary scan chains and the BIST module based on the new BIST method are presented. The new algorithm can be easily applied to any net configurations with high flexibility.",

author = "Kim, {Hyun Jin} and Jongchul Shin and Sungho Kang",

year = "1999",

language = "English",

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note = "International Conference on Computer Design (ICCD'99) ; Conference date: 10-10-1999 Through 13-10-1999",

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AU - Kim, Hyun Jin

AU - Shin, Jongchul

AU - Kang, Sungho

PY - 1999

Y1 - 1999

N2 - In this paper, an efficient BIST method for applying tests is developed without collisions of the test data in 3-state nets in a system. A new interconnect test algorithm in multiple boundary scan chains and the BIST module based on the new BIST method are presented. The new algorithm can be easily applied to any net configurations with high flexibility.

AB - In this paper, an efficient BIST method for applying tests is developed without collisions of the test data in 3-state nets in a system. A new interconnect test algorithm in multiple boundary scan chains and the BIST module based on the new BIST method are presented. The new algorithm can be easily applied to any net configurations with high flexibility.

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M3 - Paper

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SP - 328

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T2 - International Conference on Computer Design (ICCD'99)

Y2 - 10 October 1999 through 13 October 1999

ER -

Efficient interconnect test using BIST module in a boundary-scan environment

Abstract

Other

All Science Journal Classification (ASJC) codes

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