Efficient and reliable NAND flash channel for high-speed solid state drives

Joohyeong Yoon; Won Seob Jeong; Won Jeon; Won Woo Ro

doi:10.23919/ELINFOCOM.2018.8330553

Efficient and reliable NAND flash channel for high-speed solid state drives

Joohyeong Yoon, Won Seob Jeong, Won Jeon, Won Woo Ro

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

Current generation NAND Flash Memories (NFMs) focused on optimizing data transfer time. However, depends on our analysis, the proportion of control overhead in channel efficiency has increased by up to 30.1%. By increasing the transmission rate of the control signals, it is possible to improve I/O bandwidth of NFM by 11.6%. However, this method can lead to reliability problems. Thus, we propose error detection schemes in order to compensate the reliability of the control signals. Experimental results show that the proposed scheme can improve the I/O bandwidth by about 11.1% and have a reliability for burst errors.

Original language	English
Title of host publication	International Conference on Electronics, Information and Communication, ICEIC 2018
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1-4
Number of pages	4
ISBN (Electronic)	9781538647547
DOIs	https://doi.org/10.23919/ELINFOCOM.2018.8330553
Publication status	Published - 2018 Apr 2
Event	17th International Conference on Electronics, Information and Communication, ICEIC 2018 - Honolulu, United States Duration: 2018 Jan 24 → 2018 Jan 27

Publication series

Name	International Conference on Electronics, Information and Communication, ICEIC 2018
Volume	2018-January

Other

Other	17th International Conference on Electronics, Information and Communication, ICEIC 2018
Country/Territory	United States
City	Honolulu
Period	18/1/24 → 18/1/27

Bibliographical note

Publisher Copyright:
© 2018 Institute of Electronics and Information Engineers.

All Science Journal Classification (ASJC) codes

Information Systems
Computer Networks and Communications
Computer Science Applications
Signal Processing
Electrical and Electronic Engineering

Access to Document

10.23919/ELINFOCOM.2018.8330553

Cite this

Yoon, J., Jeong, W. S., Jeon, W., & Ro, W. W. (2018). Efficient and reliable NAND flash channel for high-speed solid state drives. In International Conference on Electronics, Information and Communication, ICEIC 2018 (pp. 1-4). (International Conference on Electronics, Information and Communication, ICEIC 2018; Vol. 2018-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/ELINFOCOM.2018.8330553

Yoon, Joohyeong ; Jeong, Won Seob ; Jeon, Won et al. / Efficient and reliable NAND flash channel for high-speed solid state drives. International Conference on Electronics, Information and Communication, ICEIC 2018. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 1-4 (International Conference on Electronics, Information and Communication, ICEIC 2018).

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abstract = "Current generation NAND Flash Memories (NFMs) focused on optimizing data transfer time. However, depends on our analysis, the proportion of control overhead in channel efficiency has increased by up to 30.1%. By increasing the transmission rate of the control signals, it is possible to improve I/O bandwidth of NFM by 11.6%. However, this method can lead to reliability problems. Thus, we propose error detection schemes in order to compensate the reliability of the control signals. Experimental results show that the proposed scheme can improve the I/O bandwidth by about 11.1% and have a reliability for burst errors.",

keywords = "Control overhead, Error detection, NAND flash memory, Reliability, Solid State Drives",

author = "Joohyeong Yoon and Jeong, {Won Seob} and Won Jeon and Ro, {Won Woo}",

note = "Publisher Copyright: {\textcopyright} 2018 Institute of Electronics and Information Engineers.; 17th International Conference on Electronics, Information and Communication, ICEIC 2018 ; Conference date: 24-01-2018 Through 27-01-2018",

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Yoon, J, Jeong, WS, Jeon, W & Ro, WW 2018, Efficient and reliable NAND flash channel for high-speed solid state drives. in International Conference on Electronics, Information and Communication, ICEIC 2018. International Conference on Electronics, Information and Communication, ICEIC 2018, vol. 2018-January, Institute of Electrical and Electronics Engineers Inc., pp. 1-4, 17th International Conference on Electronics, Information and Communication, ICEIC 2018, Honolulu, United States, 18/1/24. https://doi.org/10.23919/ELINFOCOM.2018.8330553

Efficient and reliable NAND flash channel for high-speed solid state drives. / Yoon, Joohyeong; Jeong, Won Seob; Jeon, Won et al.
International Conference on Electronics, Information and Communication, ICEIC 2018. Institute of Electrical and Electronics Engineers Inc., 2018. p. 1-4 (International Conference on Electronics, Information and Communication, ICEIC 2018; Vol. 2018-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Efficient and reliable NAND flash channel for high-speed solid state drives

AU - Yoon, Joohyeong

AU - Jeong, Won Seob

AU - Jeon, Won

AU - Ro, Won Woo

PY - 2018/4/2

Y1 - 2018/4/2

N2 - Current generation NAND Flash Memories (NFMs) focused on optimizing data transfer time. However, depends on our analysis, the proportion of control overhead in channel efficiency has increased by up to 30.1%. By increasing the transmission rate of the control signals, it is possible to improve I/O bandwidth of NFM by 11.6%. However, this method can lead to reliability problems. Thus, we propose error detection schemes in order to compensate the reliability of the control signals. Experimental results show that the proposed scheme can improve the I/O bandwidth by about 11.1% and have a reliability for burst errors.

AB - Current generation NAND Flash Memories (NFMs) focused on optimizing data transfer time. However, depends on our analysis, the proportion of control overhead in channel efficiency has increased by up to 30.1%. By increasing the transmission rate of the control signals, it is possible to improve I/O bandwidth of NFM by 11.6%. However, this method can lead to reliability problems. Thus, we propose error detection schemes in order to compensate the reliability of the control signals. Experimental results show that the proposed scheme can improve the I/O bandwidth by about 11.1% and have a reliability for burst errors.

KW - Control overhead

KW - Error detection

KW - NAND flash memory

KW - Reliability

KW - Solid State Drives

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Yoon J, Jeong WS, Jeon W, Ro WW. Efficient and reliable NAND flash channel for high-speed solid state drives. In International Conference on Electronics, Information and Communication, ICEIC 2018. Institute of Electrical and Electronics Engineers Inc. 2018. p. 1-4. (International Conference on Electronics, Information and Communication, ICEIC 2018). doi: 10.23919/ELINFOCOM.2018.8330553

Efficient and reliable NAND flash channel for high-speed solid state drives

Abstract

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