Effects on electronics exposed to high-power microwaves on the basis of a relativistic backward-wave oscillator operating on the X-band

An analysis of the effects of electromagnetic pulses from a high-power microwave (HPM) radiation technique is conducted using a relativistic backward-wave oscillator (RBWO) which uses relativistic electron beams in vacuum circuits. The application described here is based on a relativistic electron device and uses relativistic electron beams to generate high-power electromagnetic radiation. The RBWO was fabricated to operate in a relativistic region with a gamma factor (γ) of 2 at an acceleration voltage of 500 kV. A mode-converted relativistic back-wave oscillator with an antenna that converts TM₀₁ to TE₁₁ was designed and fabricated because the electric field of the center in the RBWO circuit is null. The effects on electronic devices by HPM radiation and exposure were assessed. The effects on electronic devices exposed to HPMs, the failure of information equipment, and modulation of and interference with the received signal through a theoretical model of the threshold power relative to the influence on the target were confirmed in a high-output microwave exposure environment. Particularly, information devices containing semiconductors can undergo serious failures and breakdowns due to the thermal secondary breakdown caused by the high-output transient electromagnetic waves, and it is a theoretical consideration that reverse voltage occurs due to the generation of surge current when caught in the PN-junction region. Finally, the range of power regarding the effectiveness of the electromagnetic coupling of electronics exposed to HPM radiation was estimated.