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Effects of post-metallization annealing of high-K dielectric thin films grown by MOMBE
Minseong Yun, Myoung Seok Kim, Young Don Ko, Tae Hyoung Moon, Jang Hyuk Hong, Jae Min Myoung, Ilgu Yun
Research output: Contribution to journal › Article › peer-review
11
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(Scopus)