TY - GEN
T1 - Effective fingerprint classification by localized models of support vector machines
AU - Min, Jun Ki
AU - Hong, Jin Hyuk
AU - Cho, Sung Bae
PY - 2006
Y1 - 2006
N2 - Fingerprint classification is useful as a preliminary step of the matching process and is performed in order to reduce searching time. Various classifiers like support vector machines (SVMs) have been used to fingerprint classification. Since the SVM which achieves high accuracy in pattern classification is a binary classifier, we propose a classifier-fusion method, multiple decision templates (MuDTs). The proposed method extracts several clusters of different characteristics from each class of fingerprints and constructs localized classification models in order to overcome restrictions to ambiguous fingerprints. Experimental results show the feasibility and validity of the proposed method.
AB - Fingerprint classification is useful as a preliminary step of the matching process and is performed in order to reduce searching time. Various classifiers like support vector machines (SVMs) have been used to fingerprint classification. Since the SVM which achieves high accuracy in pattern classification is a binary classifier, we propose a classifier-fusion method, multiple decision templates (MuDTs). The proposed method extracts several clusters of different characteristics from each class of fingerprints and constructs localized classification models in order to overcome restrictions to ambiguous fingerprints. Experimental results show the feasibility and validity of the proposed method.
UR - http://www.scopus.com/inward/record.url?scp=33744964937&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33744964937&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:33744964937
SN - 3540311114
SN - 9783540311119
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 287
EP - 293
BT - Advances in Biometrics - International Conference, ICB 2006, Proceedings
T2 - International Conference on Biometrics, ICB 2006
Y2 - 5 January 2006 through 7 January 2006
ER -