Abstract
We controlled interlayer coupling from ferromagnetic to antiferromagnetic by appropriately capping spin valves with thin oxides. The interlayer coupling field was -16.6 Oe at a Cu-spacer thickness of 30 Å. The sign of coupling changed at a Cu-spacer thickness of 20 Å. The antiferromagnetic coupling achieved in this way allowed a reduction of thickness of the Cu spacer down to 20 Å without loss of good magnetic and electrical properties, and this led to a significant improvement in the MR response of the spin valves. The interlayer coupling field was only +8.6 Oe even at a Cu-spacer thickness of 20 Å. We attribute the improvement in MR response to less current shunting through the most conductive Cu layer and to enhanced specular scattering at the interface between the free and the oxide capping layer.
Original language | English |
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Pages (from-to) | 2629-2631 |
Number of pages | 3 |
Journal | IEEE Transactions on Magnetics |
Volume | 36 |
Issue number | 5 I |
DOIs | |
Publication status | Published - 2000 Sept |
Event | 2000 International Magnetics Conference (INTERMAG 2000) - Toronto, Ont, Canada Duration: 2000 Apr 9 → 2000 Apr 12 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering