Effect of the angle accuracy in reduced-phase dual-illumination interferometer

Behnam Tayebi, Mohammad Reza Jafar Fard, Farnaz Sharif, Dug Young Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)


Reduced-phase dual-illumination interferometer (RPDII) is an off axis, single shot and single wavelength phase imaging technique to measure large objects without using unwrapping algorithms. Two beams of this interferometer illuminate a sample at different incident angles, two phases of the different incident angles and their phase difference are recorded. The phase difference between two beams can be controlled by adjusting the incident angles. The angle accuracy that decrease the RPDII accuracy have been studied. We have shown, the groove spacing of the grating and magnification of the lens system before sample, determine the incident angle accuracy. The ability of RPDII to unwrap large phases is shown by reconstructing phase of a step object without using unwrapping algorithms. The reconstructed image shows that the total inaccuracy is much more than the inaccuracy caused by incident angles.

Original languageEnglish
Title of host publicationHolography, Diffractive Optics, and Applications VI
EditorsYunlong Sheng, Changhe Zhou, Chongxiu Yu
ISBN (Electronic)9781628413441
Publication statusPublished - 2014
EventHolography, Diffractive Optics, and Applications VI - Beijing, China
Duration: 2014 Oct 92014 Oct 11

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


OtherHolography, Diffractive Optics, and Applications VI

Bibliographical note

Publisher Copyright:
© 2014 SPIE.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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