Fingerprint
Dive into the research topics of 'Effect of Si capping layer on the interface quality and NBTI of high mobility channel Ge-on-Si pMOSFETs'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Effect of Si capping layer on the interface quality and NBTI of high mobility channel Ge-on-Si pMOSFETs
Ook Sang Yoo, Jungwoo Oh, Kyung Seok Min, Chang Yong Kang, B. H. Lee, Kyong Taek Lee, Min Ki Na, Hyuk Min Kwon, P. Majhi, H. H. Tseng, Raj Jammy, J. S. Wang, Hi Deok Lee
Research output: Contribution to journal › Article › peer-review
6
Citations
(Scopus)