Effect of a single defective mask element on the multiplex advantage in Hadamard transform spectroscopy

Stephen A. Dyer; Jin Bae Park

doi:10.1366/0003702894203372

Effect of a single defective mask element on the multiplex advantage in Hadamard transform spectroscopy

Stephen A. Dyer, Jin Bae Park

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

The effect of a single defective mask element on the output signal-to-noise ratio (SNR) for a stationary-mask Hadamard transform (HT) spectrometer is investigated. The decrease in output-SNR from that of an HT spectrometer having a perfect mask is found to be dependent on the amount of energy impinging on the defective element. A method of compensating for the defective mask element is presented. The method is computationally inexpensive and can be fully automated.

Original language	English
Pages (from-to)	278-283
Number of pages	6
Journal	Applied Spectroscopy
Volume	43
Issue number	2
DOIs	https://doi.org/10.1366/0003702894203372
Publication status	Published - 1989

All Science Journal Classification (ASJC) codes

Instrumentation
Spectroscopy

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10.1366/0003702894203372

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abstract = "The effect of a single defective mask element on the output signal-to-noise ratio (SNR) for a stationary-mask Hadamard transform (HT) spectrometer is investigated. The decrease in output-SNR from that of an HT spectrometer having a perfect mask is found to be dependent on the amount of energy impinging on the defective element. A method of compensating for the defective mask element is presented. The method is computationally inexpensive and can be fully automated.",

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Effect of a single defective mask element on the multiplex advantage in Hadamard transform spectroscopy

Abstract

All Science Journal Classification (ASJC) codes

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