Abstract
A deinterlacing algorithm based on edge-dependent interpolation (EDI) that considers edge patterns is proposed. Generally, EDI algorithms perform visually better than other deinterlacing algorithms using one field. However, they produce unpleasant results due to failure in estimating edge direction. To estimate the edge direction precisely, not only simple differences between adjacent two lines but also edge patterns are used. Edge patterns, which give sufficient information to estimate the edge direction, appear along the edge direction. Therefore, we analyze properties of edge patterns and model them as a weight function. The weight function helps the proposed method to estimate the edge direction precisely. Experimental results indicate that the proposed algorithm outperforms conventional EDI approaches with respect to both objective and subjective criteria.
| Original language | English |
|---|---|
| Article number | 043003 |
| Journal | Journal of Electronic Imaging |
| Volume | 15 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 2006 Oct |
Bibliographical note
Funding Information:This research was supported by the LG YonAm Foundation and by the Ministry of Information and Communication, Korea, under the Information Technology Research Center support program supervised by the Institute of Information Technology Assessment [IITA-2005-(c(1090-0502-0028))].
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Computer Science Applications
- Electrical and Electronic Engineering