Dual-wavelength off-axis digital holography using a single light-emitting diode

C. H.O. Janghyun; L. I.M. Jinsang; Sungbin Jeon; Guk Jong Choi; Hyungbae Moon; No Cheol Park; Young Pil Park

doi:10.1364/OE.26.002123

Dual-wavelength off-axis digital holography using a single light-emitting diode

C. H.O. Janghyun, L. I.M. Jinsang, Sungbin Jeon, Guk Jong Choi, Hyungbae Moon, No Cheol Park, Young Pil Park

Department of Mechanical Engineering

Research output: Contribution to journal › Article › peer-review

17 Citations (Scopus)

Abstract

We propose a new low-coherence interferometry system for dual-wavelength off-axis digital holography. By utilizing diffraction gratings, two beams with narrower bandwidths and different center wavelengths could be filtered in a single light-emitting diode. The characteristics of the system are analytically determined to extend the coherence length and field-of-view enough for off-axis configuration. The proposed system enables the fast and accurate measurement of the surface profile with more than a micrometer step height and less noise. The performance of the system is verified by the experimental results of a standard height sample.

Original language	English
Pages (from-to)	2123-2131
Number of pages	9
Journal	Optics Express
Volume	26
Issue number	2
DOIs	https://doi.org/10.1364/OE.26.002123
Publication status	Published - 2018 Jan 22

Bibliographical note

Publisher Copyright:
© 2018 Optical Society of America.

All Science Journal Classification (ASJC) codes

Atomic and Molecular Physics, and Optics

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10.1364/OE.26.002123

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abstract = "We propose a new low-coherence interferometry system for dual-wavelength off-axis digital holography. By utilizing diffraction gratings, two beams with narrower bandwidths and different center wavelengths could be filtered in a single light-emitting diode. The characteristics of the system are analytically determined to extend the coherence length and field-of-view enough for off-axis configuration. The proposed system enables the fast and accurate measurement of the surface profile with more than a micrometer step height and less noise. The performance of the system is verified by the experimental results of a standard height sample.",

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AU - Jeon, Sungbin

AU - Choi, Guk Jong

AU - Moon, Hyungbae

AU - Park, No Cheol

AU - Park, Young Pil

PY - 2018/1/22

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AB - We propose a new low-coherence interferometry system for dual-wavelength off-axis digital holography. By utilizing diffraction gratings, two beams with narrower bandwidths and different center wavelengths could be filtered in a single light-emitting diode. The characteristics of the system are analytically determined to extend the coherence length and field-of-view enough for off-axis configuration. The proposed system enables the fast and accurate measurement of the surface profile with more than a micrometer step height and less noise. The performance of the system is verified by the experimental results of a standard height sample.

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Dual-wavelength off-axis digital holography using a single light-emitting diode

Abstract

Bibliographical note

All Science Journal Classification (ASJC) codes

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