Dual-wavelength Fourier ptychography using a single LED

Guk Jong Choi; Jinsang Lim; Sungbin Jeon; Janghyun Cho; Geon Lim; No Cheol Park; Young Pil Park

doi:10.1364/OL.43.003526

Dual-wavelength Fourier ptychography using a single LED

Guk Jong Choi, Jinsang Lim, Sungbin Jeon, Janghyun Cho, Geon Lim, No Cheol Park, Young Pil Park

Department of Mechanical Engineering

Research output: Contribution to journal › Article › peer-review

11 Citations (Scopus)

Abstract

We propose dual-wavelength Fourier ptychography for topographic measurement. To extend the axial measurement range, a single light-emitting diode (LED) and two appropriate bandpass filters are employed. This provides a speckle-free phase image, and reduces the possibility of a systematic error, which yields a high-quality topographic image. The proposed system can measure the surface topography in the range of nano- to micro-structures. The performance of the system is experimentally verified.

Original language	English
Pages (from-to)	3526-3529
Number of pages	4
Journal	Optics Letters
Volume	43
Issue number	15
DOIs	https://doi.org/10.1364/OL.43.003526
Publication status	Published - 2018 Aug 1

Bibliographical note

Funding Information:
Funding. National Research Foundation of Korea (NRF) (2015R1A5A1037668).

Publisher Copyright:
© 2018 Optical Society of America.

All Science Journal Classification (ASJC) codes

Atomic and Molecular Physics, and Optics

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10.1364/OL.43.003526

Cite this

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author = "Choi, {Guk Jong} and Jinsang Lim and Sungbin Jeon and Janghyun Cho and Geon Lim and Park, {No Cheol} and Park, {Young Pil}",

note = "Funding Information: Funding. National Research Foundation of Korea (NRF) (2015R1A5A1037668). Publisher Copyright: {\textcopyright} 2018 Optical Society of America.",

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AU - Choi, Guk Jong

AU - Lim, Jinsang

AU - Jeon, Sungbin

AU - Cho, Janghyun

AU - Lim, Geon

AU - Park, No Cheol

AU - Park, Young Pil

PY - 2018/8/1

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AB - We propose dual-wavelength Fourier ptychography for topographic measurement. To extend the axial measurement range, a single light-emitting diode (LED) and two appropriate bandpass filters are employed. This provides a speckle-free phase image, and reduces the possibility of a systematic error, which yields a high-quality topographic image. The proposed system can measure the surface topography in the range of nano- to micro-structures. The performance of the system is experimentally verified.

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Dual-wavelength Fourier ptychography using a single LED

Abstract

Bibliographical note

All Science Journal Classification (ASJC) codes

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