Dual-wavelength Fourier ptychography using a single LED

Guk Jong Choi, Jinsang Lim, Sungbin Jeon, Janghyun Cho, Geon Lim, No Cheol Park, Young Pil Park

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)


We propose dual-wavelength Fourier ptychography for topographic measurement. To extend the axial measurement range, a single light-emitting diode (LED) and two appropriate bandpass filters are employed. This provides a speckle-free phase image, and reduces the possibility of a systematic error, which yields a high-quality topographic image. The proposed system can measure the surface topography in the range of nano- to micro-structures. The performance of the system is experimentally verified.

Original languageEnglish
Pages (from-to)3526-3529
Number of pages4
JournalOptics Letters
Issue number15
Publication statusPublished - 2018 Aug 1

Bibliographical note

Funding Information:
Funding. National Research Foundation of Korea (NRF) (2015R1A5A1037668).

Publisher Copyright:
© 2018 Optical Society of America.

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics


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