Dual-wavelength diffraction phase microscopy for real-time dispersion measurement

Mohammad Reza Jafarfard, Behnam Tayebi, Dug Young Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)


We present a dual-wavelength diffraction phase microscopy (DW-DPM) that obtains the wavelength-differentiated dual phase images in a single shot of interference fringe acquisition. For this, the diffraction phase microscopy (DPM) system was constructed with a transmission grating and a spatial filter that form a common-path interferometer. With a light source of two spectral components, a different diffraction order of the grating was utilized for each. This resulted in a combined but distinguishable interference pattern to be acquired by a single image sensor. In this research, our dualwavelength phase imaging scheme was applied to simultaneously measure dispersion of a sample. Stable and reliable measurements could be performed in a single shot due to the robust structure of our DW-DPM system.

Original languageEnglish
Title of host publicationInterferometry XVII
Subtitle of host publicationTechniques and Analysis
EditorsKatherine Creath, Jan Burke, Joanna Schmit
ISBN (Electronic)9781628412307
Publication statusPublished - 2014
EventInterferometry XVII: Techniques and Analysis - San Diego, United States
Duration: 2014 Aug 172014 Aug 19

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


OtherInterferometry XVII: Techniques and Analysis
Country/TerritoryUnited States
CitySan Diego

Bibliographical note

Publisher Copyright:
© 2014 SPIE.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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