Direct quantum process tomography via measuring sequential weak values

Yosep Kim, Yong Su Kim, Sang Yun Lee, Sang Wook Han, Sung Moon, Yoon Ho Kim, Young Wook Cho

Research output: Chapter in Book/Report/Conference proceedingConference contribution


We demonstrate measurement of the sequential weak value of two incompatible observables by making use of two-photon quantum interference. We also demonstrate direct quantum process tomography of a qubit channel using the sequential weak value.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationQELS_Fundamental Science, CLEO_QELS 2018
PublisherOSA - The Optical Society
ISBN (Electronic)9781557528209
Publication statusPublished - 2018
EventCLEO: QELS_Fundamental Science, CLEO_QELS 2018 - San Jose, United States
Duration: 2018 May 132018 May 18

Publication series

NameOptics InfoBase Conference Papers
VolumePart F93-CLEO_QELS 2018


OtherCLEO: QELS_Fundamental Science, CLEO_QELS 2018
Country/TerritoryUnited States
CitySan Jose

Bibliographical note

Publisher Copyright:
© OSA 2018.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials


Dive into the research topics of 'Direct quantum process tomography via measuring sequential weak values'. Together they form a unique fingerprint.

Cite this