Direct quantum process tomography via measuring sequential weak values

Yosep Kim; Yong Su Kim; Sang Yun Lee; Sang Wook Han; Sung Moon; Yoon Ho Kim; Young Wook Cho

doi:10.1364/CLEO_QELS.2018.FF1B.5

Direct quantum process tomography via measuring sequential weak values

Yosep Kim, Yong Su Kim, Sang Yun Lee, Sang Wook Han, Sung Moon, Yoon Ho Kim, Young Wook Cho

Department of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We demonstrate measurement of the sequential weak value of two incompatible observables by making use of two-photon quantum interference. We also demonstrate direct quantum process tomography of a qubit channel using the sequential weak value.

Original language	English
Title of host publication	CLEO
Subtitle of host publication	QELS_Fundamental Science, CLEO_QELS 2018
Publisher	OSA - The Optical Society
ISBN (Electronic)	9781557528209
DOIs	https://doi.org/10.1364/CLEO_QELS.2018.FF1B.5
Publication status	Published - 2018
Event	CLEO: QELS_Fundamental Science, CLEO_QELS 2018 - San Jose, United States Duration: 2018 May 13 → 2018 May 18

Publication series

Name	Optics InfoBase Conference Papers
Volume	Part F93-CLEO_QELS 2018

Other

Other	CLEO: QELS_Fundamental Science, CLEO_QELS 2018
Country/Territory	United States
City	San Jose
Period	18/5/13 → 18/5/18

Bibliographical note

Publisher Copyright:
© OSA 2018.

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Mechanics of Materials

Access to Document

10.1364/CLEO_QELS.2018.FF1B.5

Cite this

@inproceedings{f42ef3b9a91142c8b879bbb10aeb62a3,

title = "Direct quantum process tomography via measuring sequential weak values",

abstract = "We demonstrate measurement of the sequential weak value of two incompatible observables by making use of two-photon quantum interference. We also demonstrate direct quantum process tomography of a qubit channel using the sequential weak value.",

author = "Yosep Kim and Kim, {Yong Su} and Lee, {Sang Yun} and Han, {Sang Wook} and Sung Moon and Kim, {Yoon Ho} and Cho, {Young Wook}",

note = "Publisher Copyright: {\textcopyright} OSA 2018.; CLEO: QELS_Fundamental Science, CLEO_QELS 2018 ; Conference date: 13-05-2018 Through 18-05-2018",

year = "2018",

doi = "10.1364/CLEO_QELS.2018.FF1B.5",

language = "English",

series = "Optics InfoBase Conference Papers",

publisher = "OSA - The Optical Society",

booktitle = "CLEO",

}

Kim, Y, Kim, YS, Lee, SY, Han, SW, Moon, S, Kim, YH & Cho, YW 2018, Direct quantum process tomography via measuring sequential weak values. in CLEO: QELS_Fundamental Science, CLEO_QELS 2018. Optics InfoBase Conference Papers, vol. Part F93-CLEO_QELS 2018, OSA - The Optical Society, CLEO: QELS_Fundamental Science, CLEO_QELS 2018, San Jose, United States, 18/5/13. https://doi.org/10.1364/CLEO_QELS.2018.FF1B.5

TY - GEN

T1 - Direct quantum process tomography via measuring sequential weak values

AU - Kim, Yosep

AU - Kim, Yong Su

AU - Lee, Sang Yun

AU - Han, Sang Wook

AU - Moon, Sung

AU - Kim, Yoon Ho

AU - Cho, Young Wook

PY - 2018

Y1 - 2018

N2 - We demonstrate measurement of the sequential weak value of two incompatible observables by making use of two-photon quantum interference. We also demonstrate direct quantum process tomography of a qubit channel using the sequential weak value.

AB - We demonstrate measurement of the sequential weak value of two incompatible observables by making use of two-photon quantum interference. We also demonstrate direct quantum process tomography of a qubit channel using the sequential weak value.

UR - http://www.scopus.com/inward/record.url?scp=85048936010&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85048936010&partnerID=8YFLogxK

U2 - 10.1364/CLEO_QELS.2018.FF1B.5

DO - 10.1364/CLEO_QELS.2018.FF1B.5

M3 - Conference contribution

AN - SCOPUS:85048936010

T3 - Optics InfoBase Conference Papers

BT - CLEO

PB - OSA - The Optical Society

T2 - CLEO: QELS_Fundamental Science, CLEO_QELS 2018

Y2 - 13 May 2018 through 18 May 2018

ER -

Direct quantum process tomography via measuring sequential weak values

Abstract

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Bibliographical note

All Science Journal Classification (ASJC) codes

Access to Document

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Cite this