TY - GEN
T1 - Diagnostics and prognostics of electric cables in ship power systems via joint time-frequency domain reflectometry
AU - Wang, Jingjiang
AU - Crapse, Philip
AU - Shin, Yong June
AU - Dougal, Roger
PY - 2008
Y1 - 2008
N2 - The integrity of the wiring in the electric power system of a ship is vital to its safe operation. To ensure the wiring integrity, it must be tested to determine if any incipient defects exist. Due to this problem, a non-destructive, non-intrusive condition assessment technique is highly desirable. Joint time-frequency domain reflectometry (JTFDR) is proposed and the theory behind JTFDR is also discussed. The experimental results demonstrate and verify the ability of JTFDR to be effective for polytetrafluoroethylene (PTFE) coaxial cable, which has been widely adopted for military applications in ship power systems. It is shown that JTFDR has the ability to detect and locate incipient defects with high accuracy and monitor the aging process of the cables to predict both future defects and the remaining service life of the cables.
AB - The integrity of the wiring in the electric power system of a ship is vital to its safe operation. To ensure the wiring integrity, it must be tested to determine if any incipient defects exist. Due to this problem, a non-destructive, non-intrusive condition assessment technique is highly desirable. Joint time-frequency domain reflectometry (JTFDR) is proposed and the theory behind JTFDR is also discussed. The experimental results demonstrate and verify the ability of JTFDR to be effective for polytetrafluoroethylene (PTFE) coaxial cable, which has been widely adopted for military applications in ship power systems. It is shown that JTFDR has the ability to detect and locate incipient defects with high accuracy and monitor the aging process of the cables to predict both future defects and the remaining service life of the cables.
KW - Diagnostics
KW - Joint Time-Frequency Domain Reflectometry (JTFDR)
KW - PTFE
KW - Prognostics
UR - http://www.scopus.com/inward/record.url?scp=51349110006&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=51349110006&partnerID=8YFLogxK
U2 - 10.1109/IMTC.2008.4547167
DO - 10.1109/IMTC.2008.4547167
M3 - Conference contribution
AN - SCOPUS:51349110006
SN - 1424415411
SN - 9781424415410
T3 - Conference Record - IEEE Instrumentation and Measurement Technology Conference
SP - 917
EP - 921
BT - 2008 IEEE International Instrumentation and Measurement Technology Conference Proceedings, I2MTC
T2 - 2008 IEEE International Instrumentation and Measurement Technology Conference, I2MTC
Y2 - 12 May 2008 through 15 May 2008
ER -