Device Stability and Photo-Excited Charge-Collection Spectroscopy

Important performance factors and basic device physics of organic or inorganic-channel thin-film transistors (TFTs) are addressed before introducing the photo-excited charge collection spectroscopy (PECCS), so that systematic and in-depth understanding on the device stability issues may be naturally drawn in focus. Device architecture, device physics, and general stability issues in TFT (or field-effect transistor) are thus introduced in the initial sections, and in the last section our photon-probing technique is explained along with its own device physics.