TY - GEN
T1 - Development of apparatus for measuring electromagnetic shielding effectiveness at GHz frequency band
AU - Kwon, Jong Hwa
AU - Choi, Hyung Do
AU - Choi, Jae Ick
AU - Yook, Jong Gwan
PY - 2007
Y1 - 2007
N2 - We have designed and manufactured a flanged double ridged waveguide as a sample holder for measuring the electromagnetic shielding effectiveness of planar material in broadband frequency ranges up to 10 GHz. The newly proposed sample holder in this paper is with the tapered section for broadband impedance matching with the 50Ω coaxial feeding section. And we compared the measurement result with the simulation results by using the commercial software tool. The designed Sample Holder is well agreed with the fabricated ones in consideration with the design specification of S11 < -20 dB at operational frequency range. Also, to verify the measuring apparatus, we have tried to measure and compared the SEs of commercial shielding material made of NiC 100% by proposed sample holder and ASTM D4935 holder.
AB - We have designed and manufactured a flanged double ridged waveguide as a sample holder for measuring the electromagnetic shielding effectiveness of planar material in broadband frequency ranges up to 10 GHz. The newly proposed sample holder in this paper is with the tapered section for broadband impedance matching with the 50Ω coaxial feeding section. And we compared the measurement result with the simulation results by using the commercial software tool. The designed Sample Holder is well agreed with the fabricated ones in consideration with the design specification of S11 < -20 dB at operational frequency range. Also, to verify the measuring apparatus, we have tried to measure and compared the SEs of commercial shielding material made of NiC 100% by proposed sample holder and ASTM D4935 holder.
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U2 - 10.1109/ISEMC.2007.180
DO - 10.1109/ISEMC.2007.180
M3 - Conference contribution
AN - SCOPUS:47749146158
SN - 1424413508
SN - 9781424413508
T3 - IEEE International Symposium on Electromagnetic Compatibility
BT - IEEE International Symposium on Electromagnetic Compatibility, EMC 2007
T2 - IEEE International Symposium on Electromagnetic Compatibility, EMC 2007
Y2 - 9 July 2007 through 13 July 2007
ER -