Detecting and identifying faulty IoT devices in smart home with context extraction

Jiwon Choi; Hayoung Jeoung; Jihun Kim; Youngjoo Ko; Wonup Jung; Hanjun Kim; Jong Kim

doi:10.1109/DSN.2018.00068

Detecting and identifying faulty IoT devices in smart home with context extraction

Jiwon Choi, Hayoung Jeoung, Jihun Kim, Youngjoo Ko, Wonup Jung, Hanjun Kim, Jong Kim

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

51 Citations (Scopus)

Abstract

A fast and reliable method to detect faulty IoT devices is indispensable in IoT environments. In this paper, we present DICE, an automatic method to detect and identify faulty IoT devices with context extraction. Our system works in two phases. In a precomputation phase, the system precomputes sensor correlation and the transition probability between sensor states known as context. During a real-time phase, the system finds a violation of sensor correlation and transition to detect and identify the faults. In detection, we analyze the sensor data to find any missing or newly reacting IoT devices that are deviating from already grouped correlated sensors, and state transition to find the presence of an abnormal sequence. Then, the system identifies the faulty device by comparing the problematic context with the probable ones. We demonstrate that DICE identifies faulty devices accurately and promptly through the evaluation on various fault types and datasets.

Original language	English
Title of host publication	Proceedings - 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	610-621
Number of pages	12
ISBN (Electronic)	9781538655955
DOIs	https://doi.org/10.1109/DSN.2018.00068
Publication status	Published - 2018 Jul 19
Event	48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018 - Luxembourg City, Luxembourg Duration: 2018 Jun 25 → 2018 Jun 28

Publication series

Name	Proceedings - 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018

Other

Other	48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018
Country/Territory	Luxembourg
City	Luxembourg City
Period	18/6/25 → 18/6/28

Bibliographical note

Funding Information:
ACKNOWLEDGMENTS This work was supported by Samsung Research Funding Center of Samsung Electronics under Project Number SRFC-TB1403-04.

Publisher Copyright:
© 2018 IEEE.

All Science Journal Classification (ASJC) codes

Safety, Risk, Reliability and Quality
Computer Networks and Communications
Hardware and Architecture
Energy Engineering and Power Technology

Access to Document

10.1109/DSN.2018.00068

Cite this

Choi, J., Jeoung, H., Kim, J., Ko, Y., Jung, W., Kim, H., & Kim, J. (2018). Detecting and identifying faulty IoT devices in smart home with context extraction. In Proceedings - 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018 (pp. 610-621). Article 8416520 (Proceedings - 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DSN.2018.00068

Choi, Jiwon ; Jeoung, Hayoung ; Kim, Jihun et al. / Detecting and identifying faulty IoT devices in smart home with context extraction. Proceedings - 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 610-621 (Proceedings - 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018).

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title = "Detecting and identifying faulty IoT devices in smart home with context extraction",

abstract = "A fast and reliable method to detect faulty IoT devices is indispensable in IoT environments. In this paper, we present DICE, an automatic method to detect and identify faulty IoT devices with context extraction. Our system works in two phases. In a precomputation phase, the system precomputes sensor correlation and the transition probability between sensor states known as context. During a real-time phase, the system finds a violation of sensor correlation and transition to detect and identify the faults. In detection, we analyze the sensor data to find any missing or newly reacting IoT devices that are deviating from already grouped correlated sensors, and state transition to find the presence of an abnormal sequence. Then, the system identifies the faulty device by comparing the problematic context with the probable ones. We demonstrate that DICE identifies faulty devices accurately and promptly through the evaluation on various fault types and datasets.",

author = "Jiwon Choi and Hayoung Jeoung and Jihun Kim and Youngjoo Ko and Wonup Jung and Hanjun Kim and Jong Kim",

note = "Funding Information: ACKNOWLEDGMENTS This work was supported by Samsung Research Funding Center of Samsung Electronics under Project Number SRFC-TB1403-04. Publisher Copyright: {\textcopyright} 2018 IEEE.; 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018 ; Conference date: 25-06-2018 Through 28-06-2018",

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Choi, J, Jeoung, H, Kim, J, Ko, Y, Jung, W, Kim, H & Kim, J 2018, Detecting and identifying faulty IoT devices in smart home with context extraction. in Proceedings - 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018., 8416520, Proceedings - 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018, Institute of Electrical and Electronics Engineers Inc., pp. 610-621, 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018, Luxembourg City, Luxembourg, 18/6/25. https://doi.org/10.1109/DSN.2018.00068

Detecting and identifying faulty IoT devices in smart home with context extraction. / Choi, Jiwon; Jeoung, Hayoung; Kim, Jihun et al.
Proceedings - 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018. Institute of Electrical and Electronics Engineers Inc., 2018. p. 610-621 8416520 (Proceedings - 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Choi J, Jeoung H, Kim J, Ko Y, Jung W, Kim H et al. Detecting and identifying faulty IoT devices in smart home with context extraction. In Proceedings - 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018. Institute of Electrical and Electronics Engineers Inc. 2018. p. 610-621. 8416520. (Proceedings - 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018). doi: 10.1109/DSN.2018.00068

Detecting and identifying faulty IoT devices in smart home with context extraction

Abstract

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Bibliographical note

All Science Journal Classification (ASJC) codes

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