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Degradation of Off-Phase Leakage Current of FinFETs and Gate-All-Around FETs Induced by the Self-Heating Effect in the High-Frequency Operation Regime
Chuntaek Park,
Ilgu Yun
Department of Electrical and Electronic Engineering
Research output
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Contribution to journal
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Article
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peer-review
6
Citations (Scopus)
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Dive into the research topics of 'Degradation of Off-Phase Leakage Current of FinFETs and Gate-All-Around FETs Induced by the Self-Heating Effect in the High-Frequency Operation Regime'. Together they form a unique fingerprint.
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Earth and Planetary Sciences
Field Effect Transistor
100%
Fin
30%
High Frequency
20%
Thermal Resistance
10%
Time Constant
10%
Time
10%
State
10%
Comparison
10%
Input
10%
Estimate
10%
Heat
10%
Regime
10%
Pulse
10%
Engineering
Heating Effect
60%
Field-Effect Transistor
50%
Operating Frequency
30%
High Frequency
20%
Gate Electrode
10%
Simulation Environment
10%
Frequency Operation
10%
Thermal Resistance
10%
Square Pulse
10%
Operating Region
10%
Frequency Increase
10%
Thermal Capacitance
10%
Characteristics
10%
Chemistry
Leakage Current
40%
Thermal Resistance
10%
Analytical Method
10%
Time
10%
Degradation
10%
Heat
10%
Alternating Current Method
10%
Physics
Degradation
10%
Time Constant
10%
Thermal Resistance
10%
Regimes
10%
Estimates
10%
Heat
10%
Material Science
Field Effect Transistors
20%
Heat Resistance
10%