Abstract
In this study the growth of Al substituted Co ferrite thin films on thermally oxidized silicon substrates is introduced by a sol-gel method as an alternative to some of the other deposition techniques that have been used to grow Co ferrite thin films. The structural and magnetic properties studies are presented by using an X-ray diffractometer (XRD), thermogravimetry analysis (TGA), differential thermal analysis (DTA), a vibrating sample magnetometer (VSM) and atomic force microscopy (AFM) as a function of the annealing temperature.
Original language | English |
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Title of host publication | INTERMAG Europe 2002 - IEEE International Magnetics Conference |
Editors | J. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 0780373650, 9780780373655 |
DOIs | |
Publication status | Published - 2002 |
Event | 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands Duration: 2002 Apr 28 → 2002 May 2 |
Publication series
Name | INTERMAG Europe 2002 - IEEE International Magnetics Conference |
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Other
Other | 2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 |
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Country/Territory | Netherlands |
City | Amsterdam |
Period | 02/4/28 → 02/5/2 |
Bibliographical note
Publisher Copyright:©2002 IEEE.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
- Surfaces, Coatings and Films