Controlling hole injection in organic electroluminescent device by sputter-grown Cu-phthalocyanine thin films

Shin Cheul Kim; Gun Bae Lee; Myung Woon Choi; Youngsuk Roh; Chung Nam Whang; Kwangho Jeong; Jae Gyoung Lee; Sunwook Kim

doi:10.1063/1.1351842

Controlling hole injection in organic electroluminescent device by sputter-grown Cu-phthalocyanine thin films

Shin Cheul Kim, Gun Bae Lee, Myung Woon Choi, Youngsuk Roh, Chung Nam Whang, Kwangho Jeong, Jae Gyoung Lee, Sunwook Kim

Department of Physics

Research output: Contribution to journal › Article › peer-review

28 Citations (Scopus)

Abstract

A sputter-grown Cu-phthalocyanine (SG-CuPc) thin films have been employed to control the anode interface of organic electroluminescent device (OELD). Insertion of a thin SG-CuPc between the indium tin oxide and hole-transport layers enhances the hole injection in a controllable manner, which can increase the device efficiency and decrease the operation voltage without increasing the interface roughness. Time-voltage-luminescence measurements show the improved operational durability of the thin SG-CuPc inserted OELD.

Original language	English
Pages (from-to)	1445-1447
Number of pages	3
Journal	Applied Physics Letters
Volume	78
Issue number	10
DOIs	https://doi.org/10.1063/1.1351842
Publication status	Published - 2001 Mar 5

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.1351842

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title = "Controlling hole injection in organic electroluminescent device by sputter-grown Cu-phthalocyanine thin films",

abstract = "A sputter-grown Cu-phthalocyanine (SG-CuPc) thin films have been employed to control the anode interface of organic electroluminescent device (OELD). Insertion of a thin SG-CuPc between the indium tin oxide and hole-transport layers enhances the hole injection in a controllable manner, which can increase the device efficiency and decrease the operation voltage without increasing the interface roughness. Time-voltage-luminescence measurements show the improved operational durability of the thin SG-CuPc inserted OELD.",

author = "Kim, {Shin Cheul} and Lee, {Gun Bae} and Choi, {Myung Woon} and Youngsuk Roh and Whang, {Chung Nam} and Kwangho Jeong and Lee, {Jae Gyoung} and Sunwook Kim",

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AU - Kim, Shin Cheul

AU - Lee, Gun Bae

AU - Choi, Myung Woon

AU - Roh, Youngsuk

AU - Whang, Chung Nam

AU - Jeong, Kwangho

AU - Lee, Jae Gyoung

AU - Kim, Sunwook

PY - 2001/3/5

Y1 - 2001/3/5

N2 - A sputter-grown Cu-phthalocyanine (SG-CuPc) thin films have been employed to control the anode interface of organic electroluminescent device (OELD). Insertion of a thin SG-CuPc between the indium tin oxide and hole-transport layers enhances the hole injection in a controllable manner, which can increase the device efficiency and decrease the operation voltage without increasing the interface roughness. Time-voltage-luminescence measurements show the improved operational durability of the thin SG-CuPc inserted OELD.

AB - A sputter-grown Cu-phthalocyanine (SG-CuPc) thin films have been employed to control the anode interface of organic electroluminescent device (OELD). Insertion of a thin SG-CuPc between the indium tin oxide and hole-transport layers enhances the hole injection in a controllable manner, which can increase the device efficiency and decrease the operation voltage without increasing the interface roughness. Time-voltage-luminescence measurements show the improved operational durability of the thin SG-CuPc inserted OELD.

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Controlling hole injection in organic electroluminescent device by sputter-grown Cu-phthalocyanine thin films

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