TY - JOUR
T1 - Code-Width Testing-Based Compact ADC BIST Circuit
AU - Lee, Dongmyung
AU - Yoo, Kwisung
AU - Kim, Kicheol
AU - Han, Gunhee
AU - Kang, Sungho
PY - 2004/11
Y1 - 2004/11
N2 - This paper proposes a new analog-to-digital converter,(ADC) built-in self-test,(BIST) scheme based on code-width and sample-difference testing that does not require a slope-calibrated ramp signal. The proposed BIST scheme can be implemented by a simple digital circuit whose gate count is only approximately 550. The proposed BIST scheme is verified by simulation with 138 test circuits of 6-b pipeline ADC with arbitrary faults. Simulation results show that it effectively detects not only the catastrophic faults but also some parametric faults. The simulated fault coverage is approximately 99%.
AB - This paper proposes a new analog-to-digital converter,(ADC) built-in self-test,(BIST) scheme based on code-width and sample-difference testing that does not require a slope-calibrated ramp signal. The proposed BIST scheme can be implemented by a simple digital circuit whose gate count is only approximately 550. The proposed BIST scheme is verified by simulation with 138 test circuits of 6-b pipeline ADC with arbitrary faults. Simulation results show that it effectively detects not only the catastrophic faults but also some parametric faults. The simulated fault coverage is approximately 99%.
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U2 - 10.1109/TCSII.2004.836034
DO - 10.1109/TCSII.2004.836034
M3 - Article
AN - SCOPUS:9744287059
SN - 1549-7747
VL - 51
SP - 603
EP - 606
JO - IEEE Transactions on Circuits and Systems II: Express Briefs
JF - IEEE Transactions on Circuits and Systems II: Express Briefs
IS - 11
ER -