@inproceedings{c394b7a28374452194d857610cb04253,
title = "Characterization of silicon avalanche photodetectors fabricated in standard CMOS process",
abstract = "We present and characterize silicon avalanche photodetectors (APDs) fabricated with 0.18 μm standard complementary metal-oxide-semiconductor (CMOS) process. When the bias is above the avalanche breakdown voltage, the device exhibits photodetection frequency response peaking due to resonance caused by appearance of inductive components in avalanche region.",
author = "Kang, {Hyo Soon} and Lee, {Myung Jae} and Choi, {Woo Young}",
year = "2007",
language = "English",
isbn = "1424411742",
series = "Optics InfoBase Conference Papers",
publisher = "Optical Society of America",
booktitle = "Conference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007",
note = "Conference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007 ; Conference date: 26-08-2007 Through 26-08-2007",
}