Characterization methodology of transparent hard coating film on transparent substrates using capacitance-voltage measurement

Sang Myung Lee; Dongseok Shin; Ilgu Yun

doi:10.1109/ICEP.2016.7486800

Characterization methodology of transparent hard coating film on transparent substrates using capacitance-voltage measurement

Sang Myung Lee, Dongseok Shin, Ilgu Yun

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

Roll-to-roll process is widely studied for the next generation low-cost flexible display application. Maintaining the thickness uniformity of the coated layer on the transparent substrate is crucial for high-yield roll-to-roll process. However, it is hard to characterize the large-area uniformity by the conventional techniques such as ellipsometer. In this work, the capacitance-voltage measurement method is used to characterize the thickness of the transparent layers. For the experiments, the urethane-series compound polymer material is used for the coated layer on the polycarbonate substrate. After the process, the relationship between coating speed and thickness uniformity of the coated layer is then examined using capacitance-voltage measurement data.

Original language	English
Title of host publication	2016 International Conference on Electronics Packaging, ICEP 2016
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	145-148
Number of pages	4
ISBN (Electronic)	9784904090176
DOIs	https://doi.org/10.1109/ICEP.2016.7486800
Publication status	Published - 2016 Jun 7
Event	2016 International Conference on Electronics Packaging, ICEP 2016 - Hokkaido, Japan Duration: 2016 Apr 20 → 2016 Apr 22

Publication series

Name	2016 International Conference on Electronics Packaging, ICEP 2016

Other

Other	2016 International Conference on Electronics Packaging, ICEP 2016
Country/Territory	Japan
City	Hokkaido
Period	16/4/20 → 16/4/22

Bibliographical note

Funding Information:
This research was supported by the Sensitivity touch platform development and new industrialization support program through the Ministry of Trade, Industry and Energy(MOTIE) and Korea Institute for Advancement of Technology(KIAT) and LG Display. Also, this work was partially supported by Institute of BioMed-IT, Energy-IT and Smart-IT Technology (BEST), a Brain Korea 21 plus program, Yonsei University

Publisher Copyright:
© 2016 The Japan Institute of Electronics Packaging.

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering
Mechanics of Materials

Access to Document

10.1109/ICEP.2016.7486800

Cite this

Lee, S. M., Shin, D., & Yun, I. (2016). Characterization methodology of transparent hard coating film on transparent substrates using capacitance-voltage measurement. In 2016 International Conference on Electronics Packaging, ICEP 2016 (pp. 145-148). Article 7486800 (2016 International Conference on Electronics Packaging, ICEP 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICEP.2016.7486800

Lee, Sang Myung ; Shin, Dongseok ; Yun, Ilgu. / Characterization methodology of transparent hard coating film on transparent substrates using capacitance-voltage measurement. 2016 International Conference on Electronics Packaging, ICEP 2016. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 145-148 (2016 International Conference on Electronics Packaging, ICEP 2016).

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title = "Characterization methodology of transparent hard coating film on transparent substrates using capacitance-voltage measurement",

abstract = "Roll-to-roll process is widely studied for the next generation low-cost flexible display application. Maintaining the thickness uniformity of the coated layer on the transparent substrate is crucial for high-yield roll-to-roll process. However, it is hard to characterize the large-area uniformity by the conventional techniques such as ellipsometer. In this work, the capacitance-voltage measurement method is used to characterize the thickness of the transparent layers. For the experiments, the urethane-series compound polymer material is used for the coated layer on the polycarbonate substrate. After the process, the relationship between coating speed and thickness uniformity of the coated layer is then examined using capacitance-voltage measurement data.",

author = "Lee, {Sang Myung} and Dongseok Shin and Ilgu Yun",

note = "Funding Information: This research was supported by the Sensitivity touch platform development and new industrialization support program through the Ministry of Trade, Industry and Energy(MOTIE) and Korea Institute for Advancement of Technology(KIAT) and LG Display. Also, this work was partially supported by Institute of BioMed-IT, Energy-IT and Smart-IT Technology (BEST), a Brain Korea 21 plus program, Yonsei University Publisher Copyright: {\textcopyright} 2016 The Japan Institute of Electronics Packaging.; 2016 International Conference on Electronics Packaging, ICEP 2016 ; Conference date: 20-04-2016 Through 22-04-2016",

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doi = "10.1109/ICEP.2016.7486800",

language = "English",

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Lee, SM, Shin, D & Yun, I 2016, Characterization methodology of transparent hard coating film on transparent substrates using capacitance-voltage measurement. in 2016 International Conference on Electronics Packaging, ICEP 2016., 7486800, 2016 International Conference on Electronics Packaging, ICEP 2016, Institute of Electrical and Electronics Engineers Inc., pp. 145-148, 2016 International Conference on Electronics Packaging, ICEP 2016, Hokkaido, Japan, 16/4/20. https://doi.org/10.1109/ICEP.2016.7486800

Characterization methodology of transparent hard coating film on transparent substrates using capacitance-voltage measurement. / Lee, Sang Myung; Shin, Dongseok; Yun, Ilgu.
2016 International Conference on Electronics Packaging, ICEP 2016. Institute of Electrical and Electronics Engineers Inc., 2016. p. 145-148 7486800 (2016 International Conference on Electronics Packaging, ICEP 2016).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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N1 - Funding Information: This research was supported by the Sensitivity touch platform development and new industrialization support program through the Ministry of Trade, Industry and Energy(MOTIE) and Korea Institute for Advancement of Technology(KIAT) and LG Display. Also, this work was partially supported by Institute of BioMed-IT, Energy-IT and Smart-IT Technology (BEST), a Brain Korea 21 plus program, Yonsei University Publisher Copyright: © 2016 The Japan Institute of Electronics Packaging.

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Y1 - 2016/6/7

N2 - Roll-to-roll process is widely studied for the next generation low-cost flexible display application. Maintaining the thickness uniformity of the coated layer on the transparent substrate is crucial for high-yield roll-to-roll process. However, it is hard to characterize the large-area uniformity by the conventional techniques such as ellipsometer. In this work, the capacitance-voltage measurement method is used to characterize the thickness of the transparent layers. For the experiments, the urethane-series compound polymer material is used for the coated layer on the polycarbonate substrate. After the process, the relationship between coating speed and thickness uniformity of the coated layer is then examined using capacitance-voltage measurement data.

AB - Roll-to-roll process is widely studied for the next generation low-cost flexible display application. Maintaining the thickness uniformity of the coated layer on the transparent substrate is crucial for high-yield roll-to-roll process. However, it is hard to characterize the large-area uniformity by the conventional techniques such as ellipsometer. In this work, the capacitance-voltage measurement method is used to characterize the thickness of the transparent layers. For the experiments, the urethane-series compound polymer material is used for the coated layer on the polycarbonate substrate. After the process, the relationship between coating speed and thickness uniformity of the coated layer is then examined using capacitance-voltage measurement data.

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Lee SM, Shin D, Yun I. Characterization methodology of transparent hard coating film on transparent substrates using capacitance-voltage measurement. In 2016 International Conference on Electronics Packaging, ICEP 2016. Institute of Electrical and Electronics Engineers Inc. 2016. p. 145-148. 7486800. (2016 International Conference on Electronics Packaging, ICEP 2016). doi: 10.1109/ICEP.2016.7486800

Characterization methodology of transparent hard coating film on transparent substrates using capacitance-voltage measurement

Abstract

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