Built-In Self-Test for static ADC testing with a triangle-wave

Incheol Kim; Ingeol Lee; Sungho Kang

doi:10.1587/transele.E96.C.292

Built-In Self-Test for static ADC testing with a triangle-wave

Incheol Kim, Ingeol Lee, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

This paper proposes a new BIST (Built-In Self-Test) method for static testing of an ADC (Analog-to-Digital Converter) with transition detection method. The proposed BIST uses a triangle-wave as an input test stimulus and calculates the ADC's static parameters. Simulation results show that the proposed BIST can test both rising and falling transitions with minimal hardware overhead.

Original language	English
Pages (from-to)	292-294
Number of pages	3
Journal	IEICE Transactions on Electronics
Volume	E96-C
Issue number	2
DOIs	https://doi.org/10.1587/transele.E96.C.292
Publication status	Published - 2013 Feb

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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10.1587/transele.E96.C.292

Cite this

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abstract = "This paper proposes a new BIST (Built-In Self-Test) method for static testing of an ADC (Analog-to-Digital Converter) with transition detection method. The proposed BIST uses a triangle-wave as an input test stimulus and calculates the ADC's static parameters. Simulation results show that the proposed BIST can test both rising and falling transitions with minimal hardware overhead.",

author = "Incheol Kim and Ingeol Lee and Sungho Kang",

year = "2013",

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Built-In Self-Test for static ADC testing with a triangle-wave

Abstract

All Science Journal Classification (ASJC) codes

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