Buckling of a stiff thin film on a compliant substrate in large deformation

J. Song, H. Jiang, Z. J. Liu, D. Y. Khang, Y. Huang, J. A. Rogers, C. Lu, C. G. Koh

Research output: Contribution to journalArticlepeer-review

228 Citations (Scopus)


A finite-deformation theory is developed to study the mechanics of thin buckled films on compliant substrates. Perturbation analysis is performed for this highly nonlinear system to obtain the analytical solution. The results agree well with experiments and finite element analysis in wavelength and amplitude. In particular, it is found that the wavelength depends on the strain. Based on the accurate wavelength and amplitude, the membrane and peak strains in thin films, and stretchability and compressibility of the system are also obtained analytically.

Original languageEnglish
Pages (from-to)3107-3121
Number of pages15
JournalInternational Journal of Solids and Structures
Issue number10
Publication statusPublished - 2008 May 15

Bibliographical note

Funding Information:
We acknowledge the support from the National Science Foundation under Grant DMI-0328162, the U.S. Department of Energy, Division of Materials Sciences under Award No. DEFG02-91ER45439, through the Frederick Seitz MRL and Center for Microanalysis of Materials at the University of Illinois at Urbana-Champaign. H.J., Y.H., and Z.J.L., acknowledge the support from NSF CMMI-0700440, NSFC, and the Institute of High Performance Computing in Singapore, respectively.

All Science Journal Classification (ASJC) codes

  • Modelling and Simulation
  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Applied Mathematics


Dive into the research topics of 'Buckling of a stiff thin film on a compliant substrate in large deformation'. Together they form a unique fingerprint.

Cite this