Buckling of a stiff thin film on a compliant substrate in large deformation

J. Song; H. Jiang; Z. J. Liu; D. Y. Khang; Y. Huang; J. A. Rogers; C. Lu; C. G. Koh

doi:10.1016/j.ijsolstr.2008.01.023

Buckling of a stiff thin film on a compliant substrate in large deformation

J. Song, H. Jiang, Z. J. Liu, D. Y. Khang, Y. Huang, J. A. Rogers, C. Lu, C. G. Koh

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

228 Citations (Scopus)

Abstract

A finite-deformation theory is developed to study the mechanics of thin buckled films on compliant substrates. Perturbation analysis is performed for this highly nonlinear system to obtain the analytical solution. The results agree well with experiments and finite element analysis in wavelength and amplitude. In particular, it is found that the wavelength depends on the strain. Based on the accurate wavelength and amplitude, the membrane and peak strains in thin films, and stretchability and compressibility of the system are also obtained analytically.

Original language	English
Pages (from-to)	3107-3121
Number of pages	15
Journal	International Journal of Solids and Structures
Volume	45
Issue number	10
DOIs	https://doi.org/10.1016/j.ijsolstr.2008.01.023
Publication status	Published - 2008 May 15

Bibliographical note

Funding Information:
We acknowledge the support from the National Science Foundation under Grant DMI-0328162, the U.S. Department of Energy, Division of Materials Sciences under Award No. DEFG02-91ER45439, through the Frederick Seitz MRL and Center for Microanalysis of Materials at the University of Illinois at Urbana-Champaign. H.J., Y.H., and Z.J.L., acknowledge the support from NSF CMMI-0700440, NSFC, and the Institute of High Performance Computing in Singapore, respectively.

All Science Journal Classification (ASJC) codes

Modelling and Simulation
Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
Applied Mathematics

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10.1016/j.ijsolstr.2008.01.023

Cite this

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abstract = "A finite-deformation theory is developed to study the mechanics of thin buckled films on compliant substrates. Perturbation analysis is performed for this highly nonlinear system to obtain the analytical solution. The results agree well with experiments and finite element analysis in wavelength and amplitude. In particular, it is found that the wavelength depends on the strain. Based on the accurate wavelength and amplitude, the membrane and peak strains in thin films, and stretchability and compressibility of the system are also obtained analytically.",

author = "J. Song and H. Jiang and Liu, {Z. J.} and Khang, {D. Y.} and Y. Huang and Rogers, {J. A.} and C. Lu and Koh, {C. G.}",

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AU - Jiang, H.

AU - Liu, Z. J.

AU - Khang, D. Y.

AU - Huang, Y.

AU - Rogers, J. A.

AU - Lu, C.

AU - Koh, C. G.

N1 - Funding Information: We acknowledge the support from the National Science Foundation under Grant DMI-0328162, the U.S. Department of Energy, Division of Materials Sciences under Award No. DEFG02-91ER45439, through the Frederick Seitz MRL and Center for Microanalysis of Materials at the University of Illinois at Urbana-Champaign. H.J., Y.H., and Z.J.L., acknowledge the support from NSF CMMI-0700440, NSFC, and the Institute of High Performance Computing in Singapore, respectively.

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Y1 - 2008/5/15

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AB - A finite-deformation theory is developed to study the mechanics of thin buckled films on compliant substrates. Perturbation analysis is performed for this highly nonlinear system to obtain the analytical solution. The results agree well with experiments and finite element analysis in wavelength and amplitude. In particular, it is found that the wavelength depends on the strain. Based on the accurate wavelength and amplitude, the membrane and peak strains in thin films, and stretchability and compressibility of the system are also obtained analytically.

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Buckling of a stiff thin film on a compliant substrate in large deformation

Abstract

Bibliographical note

All Science Journal Classification (ASJC) codes

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