Broadcast scan compression based on deterministic pattern generation algorithm

Hyeonchan Lim; Sungyoul Seo; Soyeon Kang; Sungho Kang

doi:10.1109/ISQED.2017.7918357

Broadcast scan compression based on deterministic pattern generation algorithm

Hyeonchan Lim, Sungyoul Seo, Soyeon Kang, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Citations (Scopus)

Abstract

As advances in technology make integrating more transistors on a single integrated circuit (IC) feasible, test data volume becomes one of major factors of testing system-on-chips (SoCs). The large volume of test data leads to increasing test application time and needs more expensive Automatic test equipment (ATE) with high memory. In this paper, we present broadcast scan compression based on deterministic pattern generation algorithm to reduce the volume of test data. The proposed method further improves compression ratio of the volume of test data by exploiting advances of both broadcast scan compression and pattern generation using linear feedback shift register (LFSR). The volume of test data can be reduced by feeding multiple scan chains from a few LFSRs and by compressing the data using LFSRs. ISCAS'89 benchmark circuits verify the proposed method and the experimental results show that the compression ratio is up to 10× which means test application time also is reduced extremely.

Original language	English
Title of host publication	Proceedings of the 18th International Symposium on Quality Electronic Design, ISQED 2017
Publisher	IEEE Computer Society
Pages	449-453
Number of pages	5
ISBN (Electronic)	9781509054046
DOIs	https://doi.org/10.1109/ISQED.2017.7918357
Publication status	Published - 2017 May 2
Event	18th International Symposium on Quality Electronic Design, ISQED 2017 - Santa Clara, United States Duration: 2017 Mar 14 → 2017 Mar 15

Publication series

Name	Proceedings - International Symposium on Quality Electronic Design, ISQED
ISSN (Print)	1948-3287
ISSN (Electronic)	1948-3295

Other

Other	18th International Symposium on Quality Electronic Design, ISQED 2017
Country/Territory	United States
City	Santa Clara
Period	17/3/14 → 17/3/15

Bibliographical note

Publisher Copyright:
© 2017 IEEE.

All Science Journal Classification (ASJC) codes

Hardware and Architecture
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality

Access to Document

10.1109/ISQED.2017.7918357

Cite this

Lim, H., Seo, S., Kang, S., & Kang, S. (2017). Broadcast scan compression based on deterministic pattern generation algorithm. In Proceedings of the 18th International Symposium on Quality Electronic Design, ISQED 2017 (pp. 449-453). Article 7918357 (Proceedings - International Symposium on Quality Electronic Design, ISQED). IEEE Computer Society. https://doi.org/10.1109/ISQED.2017.7918357

@inproceedings{2c004d4deb804854b0f98cb0b81ad732,

title = "Broadcast scan compression based on deterministic pattern generation algorithm",

abstract = "As advances in technology make integrating more transistors on a single integrated circuit (IC) feasible, test data volume becomes one of major factors of testing system-on-chips (SoCs). The large volume of test data leads to increasing test application time and needs more expensive Automatic test equipment (ATE) with high memory. In this paper, we present broadcast scan compression based on deterministic pattern generation algorithm to reduce the volume of test data. The proposed method further improves compression ratio of the volume of test data by exploiting advances of both broadcast scan compression and pattern generation using linear feedback shift register (LFSR). The volume of test data can be reduced by feeding multiple scan chains from a few LFSRs and by compressing the data using LFSRs. ISCAS'89 benchmark circuits verify the proposed method and the experimental results show that the compression ratio is up to 10× which means test application time also is reduced extremely.",

author = "Hyeonchan Lim and Sungyoul Seo and Soyeon Kang and Sungho Kang",

note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 18th International Symposium on Quality Electronic Design, ISQED 2017 ; Conference date: 14-03-2017 Through 15-03-2017",

year = "2017",

month = may,

day = "2",

doi = "10.1109/ISQED.2017.7918357",

language = "English",

series = "Proceedings - International Symposium on Quality Electronic Design, ISQED",

publisher = "IEEE Computer Society",

pages = "449--453",

booktitle = "Proceedings of the 18th International Symposium on Quality Electronic Design, ISQED 2017",

address = "United States",

}

Lim, H, Seo, S, Kang, S & Kang, S 2017, Broadcast scan compression based on deterministic pattern generation algorithm. in Proceedings of the 18th International Symposium on Quality Electronic Design, ISQED 2017., 7918357, Proceedings - International Symposium on Quality Electronic Design, ISQED, IEEE Computer Society, pp. 449-453, 18th International Symposium on Quality Electronic Design, ISQED 2017, Santa Clara, United States, 17/3/14. https://doi.org/10.1109/ISQED.2017.7918357

Broadcast scan compression based on deterministic pattern generation algorithm. / Lim, Hyeonchan; Seo, Sungyoul; Kang, Soyeon et al.
Proceedings of the 18th International Symposium on Quality Electronic Design, ISQED 2017. IEEE Computer Society, 2017. p. 449-453 7918357 (Proceedings - International Symposium on Quality Electronic Design, ISQED).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Broadcast scan compression based on deterministic pattern generation algorithm

AU - Lim, Hyeonchan

AU - Seo, Sungyoul

AU - Kang, Soyeon

AU - Kang, Sungho

PY - 2017/5/2

Y1 - 2017/5/2

N2 - As advances in technology make integrating more transistors on a single integrated circuit (IC) feasible, test data volume becomes one of major factors of testing system-on-chips (SoCs). The large volume of test data leads to increasing test application time and needs more expensive Automatic test equipment (ATE) with high memory. In this paper, we present broadcast scan compression based on deterministic pattern generation algorithm to reduce the volume of test data. The proposed method further improves compression ratio of the volume of test data by exploiting advances of both broadcast scan compression and pattern generation using linear feedback shift register (LFSR). The volume of test data can be reduced by feeding multiple scan chains from a few LFSRs and by compressing the data using LFSRs. ISCAS'89 benchmark circuits verify the proposed method and the experimental results show that the compression ratio is up to 10× which means test application time also is reduced extremely.

AB - As advances in technology make integrating more transistors on a single integrated circuit (IC) feasible, test data volume becomes one of major factors of testing system-on-chips (SoCs). The large volume of test data leads to increasing test application time and needs more expensive Automatic test equipment (ATE) with high memory. In this paper, we present broadcast scan compression based on deterministic pattern generation algorithm to reduce the volume of test data. The proposed method further improves compression ratio of the volume of test data by exploiting advances of both broadcast scan compression and pattern generation using linear feedback shift register (LFSR). The volume of test data can be reduced by feeding multiple scan chains from a few LFSRs and by compressing the data using LFSRs. ISCAS'89 benchmark circuits verify the proposed method and the experimental results show that the compression ratio is up to 10× which means test application time also is reduced extremely.

UR - http://www.scopus.com/inward/record.url?scp=85019590336&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85019590336&partnerID=8YFLogxK

U2 - 10.1109/ISQED.2017.7918357

DO - 10.1109/ISQED.2017.7918357

M3 - Conference contribution

AN - SCOPUS:85019590336

T3 - Proceedings - International Symposium on Quality Electronic Design, ISQED

SP - 449

EP - 453

BT - Proceedings of the 18th International Symposium on Quality Electronic Design, ISQED 2017

PB - IEEE Computer Society

T2 - 18th International Symposium on Quality Electronic Design, ISQED 2017

Y2 - 14 March 2017 through 15 March 2017

ER -

Broadcast scan compression based on deterministic pattern generation algorithm

Abstract

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Bibliographical note

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