TY - JOUR
T1 - Bitline charge-recycling SRAM write assist circuitry for V MIn improvement and energy saving
AU - Jeong, Hanwool
AU - Oh, Se Hyeok
AU - Oh, Tae Woo
AU - Kim, Hoonki
AU - Park, Chang Nam
AU - Rim, Woojin
AU - Song, Taejoong
AU - Jung, Seong Ook
N1 - Publisher Copyright:
© 2018 IEEE
PY - 2019/3
Y1 - 2019/3
N2 - Bitline (BL) charge-recycling-based static random access memory (SRAM) write assist circuits (BCR-WA) are proposed to reduce the minimum operating voltage (V MIN ) of SRAM. In the proposed schemes, the charges stored on the unselected BL are utilized to raise the cell ground voltage (VSS) of the selected bit cell, and the increased cell VSS (CVSS) enhances the write ability. According to the metal routing direction of CVSS in the layout, two types of BCR-WA are proposed, BCR-WA for vertical CVSS routing (BCR-WA V ) and horizontal CVSS routing (BCR-WA H ). To evaluate the proposed circuits, HSPICE simulations are performed and the test chip is implemented using a 14-nm FinFET technology. Thanks to the charge-recycling operation, BCR-WA V and BCR-WA H can save energy by 11%-44% and 30%-66%, respectively, compared to the previous write assist circuits, with a comparable or less area overhead and an insignificant degradation in read performance (<1%) and stability (∼25-mV degradation in maximum word-lin voltage). In addition, according to simulation results, BCR-WA V and BCR-WA H can lower V MIN by 150 mV. In particular, silicon measurement result for BCR-WA H proves an 125-mV improvement in V MIN .
AB - Bitline (BL) charge-recycling-based static random access memory (SRAM) write assist circuits (BCR-WA) are proposed to reduce the minimum operating voltage (V MIN ) of SRAM. In the proposed schemes, the charges stored on the unselected BL are utilized to raise the cell ground voltage (VSS) of the selected bit cell, and the increased cell VSS (CVSS) enhances the write ability. According to the metal routing direction of CVSS in the layout, two types of BCR-WA are proposed, BCR-WA for vertical CVSS routing (BCR-WA V ) and horizontal CVSS routing (BCR-WA H ). To evaluate the proposed circuits, HSPICE simulations are performed and the test chip is implemented using a 14-nm FinFET technology. Thanks to the charge-recycling operation, BCR-WA V and BCR-WA H can save energy by 11%-44% and 30%-66%, respectively, compared to the previous write assist circuits, with a comparable or less area overhead and an insignificant degradation in read performance (<1%) and stability (∼25-mV degradation in maximum word-lin voltage). In addition, according to simulation results, BCR-WA V and BCR-WA H can lower V MIN by 150 mV. In particular, silicon measurement result for BCR-WA H proves an 125-mV improvement in V MIN .
KW - Charge recycling
KW - Low-power static random access memory (SRAM)
KW - Minimum operating voltage of SRAM
KW - SRAM write assist circuit
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U2 - 10.1109/JSSC.2018.2883725
DO - 10.1109/JSSC.2018.2883725
M3 - Article
AN - SCOPUS:85059036926
SN - 0018-9200
VL - 54
SP - 896
EP - 906
JO - IEEE Journal of Solid-State Circuits
JF - IEEE Journal of Solid-State Circuits
IS - 3
M1 - 8587133
ER -