TY - GEN
T1 - Between AUC based and error rate based learning
AU - Toh, Kar Ann
PY - 2008
Y1 - 2008
N2 - Based on an earlier solution to optimize an approximated area under the ROC Curve (AUC) for binary pattern classification in [1], this paper investigates into the relationship between AUC and several error rate based classifiers. Via a generalized framework of translated scalingspace, we find that the AUC based classifier can be related to a total-error-rate (TER) classifier, an Equal Error Rate (EER) formulation, and a least-squares-error (LSE) estimator, each under a specific setting of the translated scaling-space framework. Several potential applications of the generalized framework are subsequently discussed.
AB - Based on an earlier solution to optimize an approximated area under the ROC Curve (AUC) for binary pattern classification in [1], this paper investigates into the relationship between AUC and several error rate based classifiers. Via a generalized framework of translated scalingspace, we find that the AUC based classifier can be related to a total-error-rate (TER) classifier, an Equal Error Rate (EER) formulation, and a least-squares-error (LSE) estimator, each under a specific setting of the translated scaling-space framework. Several potential applications of the generalized framework are subsequently discussed.
UR - http://www.scopus.com/inward/record.url?scp=51949101130&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=51949101130&partnerID=8YFLogxK
U2 - 10.1109/ICIEA.2008.4582893
DO - 10.1109/ICIEA.2008.4582893
M3 - Conference contribution
AN - SCOPUS:51949101130
SN - 9781424417186
T3 - 2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008
SP - 2116
EP - 2120
BT - 2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008
T2 - 2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008
Y2 - 3 June 2008 through 5 June 2008
ER -