Abstract
The two-dimensional thickness profile of a phase object can be measured by phase microscopy by assuming that the light passes straight through the sample such that the measured phase profile is proportional to the thickness of the sample. However, any non-uniform index structure in a sample bends the straight light path by refraction and diffracts the non-uniform transverse phase structure of the wavefront along the propagation path within a sample. We investigated the consequence of these two effects within a phase object using a split-step beam propagation method that considers beam paths through a 3-μm-diameter bead sample. Our simulation results show that the phase profile of light just after passing through a sample differs significantly from an ideal phase profile. We verified these simulation results by comparing them with experimental data obtained with a Mach–Zehnder interferometer.
| Original language | English |
|---|---|
| Pages (from-to) | 532-538 |
| Number of pages | 7 |
| Journal | Optical Review |
| Volume | 22 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 2015 Aug 31 |
Bibliographical note
Funding Information:This work was supported in part by grants from the Bio-imaging Research Center program at GIST and the Brain Research Program (NRF-2013M3C7A1073001) through the National Research Foundation of Korea. This work also was financially supported by the MEST through the National Research Foundation of Korea (Grant No. 012R1A4A102906) and by the Ministry of Education Science Technology of Korea through the BK21 program of the Institute of Physics and Applied Physics at Yonsei University.
Publisher Copyright:
© 2015, The Optical Society of Japan.
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics