Considering the fact that simulation patterns can detect a different number of design errors, the derivation of efficient simulation patterns is important. Automatic error pattern generation is introduced to generate a set of error simulation pattern which can be used as input stimuli for design error simulation, a design validation tool which provides a measure of simulation coverage. These tools provide a solution to a long standing problem that has limited design options and design cycle time. They also can decrease design and testing costs.
|Title of host publication
|Proceedings - 5th Annual IEEE International ASIC Conference and Exhibit, ASIC 1992
|IEEE Computer Society
|Number of pages
|Published - 1992
|5th Annual IEEE International ASIC Conference and Exhibit, ASIC 1992 - Rochester, United States
Duration: 1992 Sept 21 → 1992 Sept 25
|Proceedings of International Conference on ASIC
|5th Annual IEEE International ASIC Conference and Exhibit, ASIC 1992
|92/9/21 → 92/9/25
Bibliographical notePublisher Copyright:
© 1992 IEEE.
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Electrical and Electronic Engineering