Automated signal selection maximizing circuit coverage for efficient debug

Soon Kwan Kwon; Joon Sung Yang

doi:10.1109/ICCE-Asia.2016.7804833

Automated signal selection maximizing circuit coverage for efficient debug

Soon Kwan Kwon, Joon Sung Yang

College of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

As the complexity of chip increases, the importance of post silicon verification is escalated. Trace buffer is a commonly used hardware architecture to achieve an efficient debug process. It is advantageous since it is able to store internal values which are captured during system operation at-speed. However, it cannot store a vast number of signals due to its limited storage. Therefore, it is very important to select appropriate internal signals for efficient debug. In this paper, we propose a new signal selection scheme to detect errors as close as its occurrence cycle.

Original language	English
Title of host publication	2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781509027439
DOIs	https://doi.org/10.1109/ICCE-Asia.2016.7804833
Publication status	Published - 2017 Jan 3
Event	2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016 - Seoul, Korea, Republic of Duration: 2016 Oct 26 → 2016 Oct 28

Publication series

Name	2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016

Other

Other	2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016
Country/Territory	Korea, Republic of
City	Seoul
Period	16/10/26 → 16/10/28

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Instrumentation

Access to Document

10.1109/ICCE-Asia.2016.7804833

Cite this

Kwon, S. K., & Yang, J. S. (2017). Automated signal selection maximizing circuit coverage for efficient debug. In 2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016 [7804833] (2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCE-Asia.2016.7804833

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title = "Automated signal selection maximizing circuit coverage for efficient debug",

abstract = "As the complexity of chip increases, the importance of post silicon verification is escalated. Trace buffer is a commonly used hardware architecture to achieve an efficient debug process. It is advantageous since it is able to store internal values which are captured during system operation at-speed. However, it cannot store a vast number of signals due to its limited storage. Therefore, it is very important to select appropriate internal signals for efficient debug. In this paper, we propose a new signal selection scheme to detect errors as close as its occurrence cycle.",

author = "Kwon, {Soon Kwan} and Yang, {Joon Sung}",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016 ; Conference date: 26-10-2016 Through 28-10-2016",

year = "2017",

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doi = "10.1109/ICCE-Asia.2016.7804833",

language = "English",

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Kwon, SK & Yang, JS 2017, Automated signal selection maximizing circuit coverage for efficient debug. in 2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016., 7804833, 2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016, Institute of Electrical and Electronics Engineers Inc., 2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016, Seoul, Korea, Republic of, 16/10/26. https://doi.org/10.1109/ICCE-Asia.2016.7804833

Automated signal selection maximizing circuit coverage for efficient debug. / Kwon, Soon Kwan; Yang, Joon Sung.
2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016. Institute of Electrical and Electronics Engineers Inc., 2017. 7804833 (2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AU - Kwon, Soon Kwan

AU - Yang, Joon Sung

PY - 2017/1/3

Y1 - 2017/1/3

N2 - As the complexity of chip increases, the importance of post silicon verification is escalated. Trace buffer is a commonly used hardware architecture to achieve an efficient debug process. It is advantageous since it is able to store internal values which are captured during system operation at-speed. However, it cannot store a vast number of signals due to its limited storage. Therefore, it is very important to select appropriate internal signals for efficient debug. In this paper, we propose a new signal selection scheme to detect errors as close as its occurrence cycle.

AB - As the complexity of chip increases, the importance of post silicon verification is escalated. Trace buffer is a commonly used hardware architecture to achieve an efficient debug process. It is advantageous since it is able to store internal values which are captured during system operation at-speed. However, it cannot store a vast number of signals due to its limited storage. Therefore, it is very important to select appropriate internal signals for efficient debug. In this paper, we propose a new signal selection scheme to detect errors as close as its occurrence cycle.

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BT - 2016 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2016

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ER -

Automated signal selection maximizing circuit coverage for efficient debug

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