Abstract
Due to its capability of capturing the kinematic properties of a target object, radar micro-Doppler signatures (m-DS) play an important role in radar target classification. This is particularly evident from the remarkable number of research papers published every year on m-DS for various applications. However, most of these works rely on the support vector machine (SVM) for target classification. It is well known that training an SVM is computationally expensive due to its nature of search to locate the supporting vectors. In this paper, the classifier learning problem is addressed by a total error rate (TER) minimization where an analytic solution is available. This largely reduces the search time in the learning phase. The analytically obtained TER solution is globally optimal with respect to the classification total error count rate. Moreover, our empirical results show that TER outperforms SVM in terms of classification accuracy and computational efficiency on a five-category radar classification problem.
Original language | English |
---|---|
Title of host publication | Second International Workshop on Pattern Recognition |
Editors | Guojian Chen, Xudong Jiang, Masayuki Arai |
Publisher | SPIE |
ISBN (Electronic) | 9781510613508 |
DOIs | |
Publication status | Published - 2017 |
Event | 2nd International Workshop on Pattern Recognition, IWPR 2017 - Singapore, Singapore Duration: 2017 May 1 → 2017 May 3 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
---|---|
Volume | 10443 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Other
Other | 2nd International Workshop on Pattern Recognition, IWPR 2017 |
---|---|
Country/Territory | Singapore |
City | Singapore |
Period | 17/5/1 → 17/5/3 |
Bibliographical note
Publisher Copyright:© COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering