Analytic radar micro-Doppler signatures classification

Beom Seok Oh, Zhaoning Gu, Guan Wang, Kar Ann Toh, Zhiping Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Due to its capability of capturing the kinematic properties of a target object, radar micro-Doppler signatures (m-DS) play an important role in radar target classification. This is particularly evident from the remarkable number of research papers published every year on m-DS for various applications. However, most of these works rely on the support vector machine (SVM) for target classification. It is well known that training an SVM is computationally expensive due to its nature of search to locate the supporting vectors. In this paper, the classifier learning problem is addressed by a total error rate (TER) minimization where an analytic solution is available. This largely reduces the search time in the learning phase. The analytically obtained TER solution is globally optimal with respect to the classification total error count rate. Moreover, our empirical results show that TER outperforms SVM in terms of classification accuracy and computational efficiency on a five-category radar classification problem.

Original languageEnglish
Title of host publicationSecond International Workshop on Pattern Recognition
EditorsGuojian Chen, Xudong Jiang, Masayuki Arai
PublisherSPIE
ISBN (Electronic)9781510613508
DOIs
Publication statusPublished - 2017
Event2nd International Workshop on Pattern Recognition, IWPR 2017 - Singapore, Singapore
Duration: 2017 May 12017 May 3

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10443
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

Other2nd International Workshop on Pattern Recognition, IWPR 2017
Country/TerritorySingapore
CitySingapore
Period17/5/117/5/3

Bibliographical note

Publisher Copyright:
© COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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