Analysis of biexponential decay signals in the analog mean-delay fluorescence lifetime measurement method

Wonsang Hwang; Dongeun Kim; Seungrag Lee; Young Jae Won; Sucbei Moon; Dug Young Kim

doi:10.1016/j.optcom.2019.02.059

Analysis of biexponential decay signals in the analog mean-delay fluorescence lifetime measurement method

Wonsang Hwang, Dongeun Kim, Seungrag Lee, Young Jae Won, Sucbei Moon, Dug Young Kim

Department of Physics

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Signals obtained in fluorescence lifetime imaging microscopy (FLIM) often contain biexponential decay components, and unmixing of them is a critical issue in FLIM especially for fluorescence resonance-energy-transfer (FRET) applications. Even though the analog mean-delay (AMD) method is the fastest fluorescence lifetime measurement scheme for point-scanning confocal microscopy, its ability to analyze biexponential decay signals has not been demonstrated, yet. In this paper we have demonstrated that biexponential decay signals can be effectively analyzed with the AMD method. Effects of various measurement conditions on the accuracy of biexponential decay signal analysis are presented with numerical simulations and experimental demonstrations.

Original language	English
Pages (from-to)	136-143
Number of pages	8
Journal	Optics Communications
Volume	443
DOIs	https://doi.org/10.1016/j.optcom.2019.02.059
Publication status	Published - 2019 Jul 15

Bibliographical note

Funding Information:
National Research Foundation of Korea ( NRF-2013R1A1A2062448 ) through the Basic Science Research Program, Ministry of Trade, Industry and Energy of Korea ( 10062417 ) through Technology Innovation Program.

Publisher Copyright:
© 2019 Elsevier B.V.

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Physical and Theoretical Chemistry
Electrical and Electronic Engineering

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10.1016/j.optcom.2019.02.059

Cite this

@article{2a5c0520c32244a793e1468f6eedb61c,

title = "Analysis of biexponential decay signals in the analog mean-delay fluorescence lifetime measurement method",

abstract = "Signals obtained in fluorescence lifetime imaging microscopy (FLIM) often contain biexponential decay components, and unmixing of them is a critical issue in FLIM especially for fluorescence resonance-energy-transfer (FRET) applications. Even though the analog mean-delay (AMD) method is the fastest fluorescence lifetime measurement scheme for point-scanning confocal microscopy, its ability to analyze biexponential decay signals has not been demonstrated, yet. In this paper we have demonstrated that biexponential decay signals can be effectively analyzed with the AMD method. Effects of various measurement conditions on the accuracy of biexponential decay signal analysis are presented with numerical simulations and experimental demonstrations.",

author = "Wonsang Hwang and Dongeun Kim and Seungrag Lee and Won, {Young Jae} and Sucbei Moon and Kim, {Dug Young}",

note = "Funding Information: National Research Foundation of Korea ( NRF-2013R1A1A2062448 ) through the Basic Science Research Program, Ministry of Trade, Industry and Energy of Korea ( 10062417 ) through Technology Innovation Program. Publisher Copyright: {\textcopyright} 2019 Elsevier B.V.",

year = "2019",

month = jul,

day = "15",

doi = "10.1016/j.optcom.2019.02.059",

language = "English",

volume = "443",

pages = "136--143",

journal = "Optics Communications",

issn = "0030-4018",

publisher = "Elsevier",

}

TY - JOUR

T1 - Analysis of biexponential decay signals in the analog mean-delay fluorescence lifetime measurement method

AU - Hwang, Wonsang

AU - Kim, Dongeun

AU - Lee, Seungrag

AU - Won, Young Jae

AU - Moon, Sucbei

AU - Kim, Dug Young

N1 - Funding Information: National Research Foundation of Korea ( NRF-2013R1A1A2062448 ) through the Basic Science Research Program, Ministry of Trade, Industry and Energy of Korea ( 10062417 ) through Technology Innovation Program. Publisher Copyright: © 2019 Elsevier B.V.

PY - 2019/7/15

Y1 - 2019/7/15

N2 - Signals obtained in fluorescence lifetime imaging microscopy (FLIM) often contain biexponential decay components, and unmixing of them is a critical issue in FLIM especially for fluorescence resonance-energy-transfer (FRET) applications. Even though the analog mean-delay (AMD) method is the fastest fluorescence lifetime measurement scheme for point-scanning confocal microscopy, its ability to analyze biexponential decay signals has not been demonstrated, yet. In this paper we have demonstrated that biexponential decay signals can be effectively analyzed with the AMD method. Effects of various measurement conditions on the accuracy of biexponential decay signal analysis are presented with numerical simulations and experimental demonstrations.

AB - Signals obtained in fluorescence lifetime imaging microscopy (FLIM) often contain biexponential decay components, and unmixing of them is a critical issue in FLIM especially for fluorescence resonance-energy-transfer (FRET) applications. Even though the analog mean-delay (AMD) method is the fastest fluorescence lifetime measurement scheme for point-scanning confocal microscopy, its ability to analyze biexponential decay signals has not been demonstrated, yet. In this paper we have demonstrated that biexponential decay signals can be effectively analyzed with the AMD method. Effects of various measurement conditions on the accuracy of biexponential decay signal analysis are presented with numerical simulations and experimental demonstrations.

UR - http://www.scopus.com/inward/record.url?scp=85062922223&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85062922223&partnerID=8YFLogxK

U2 - 10.1016/j.optcom.2019.02.059

DO - 10.1016/j.optcom.2019.02.059

M3 - Article

AN - SCOPUS:85062922223

SN - 0030-4018

VL - 443

SP - 136

EP - 143

JO - Optics Communications

JF - Optics Communications

ER -

Analysis of biexponential decay signals in the analog mean-delay fluorescence lifetime measurement method

Abstract

Bibliographical note

All Science Journal Classification (ASJC) codes

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